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BM71BLE01FC2 数据表(PDF) 35 Page - Microchip Technology |
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BM71BLE01FC2 数据表(HTML) 35 Page - Microchip Technology |
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35 / 64 page ![]() 2015-2016 Microchip Technology Inc. DS60001372D-Page 35 BM70/71 5.0 ELECTRICAL CHARACTERISTICS This section provides an overview of the BM70/71 modules electrical characteristics. Additional information will be provided in future revisions of this document. Absolute maximum ratings for the BM70/71 devices are listed here. Exposure to the maximum rating conditions for extended periods may affect device reliability. Functional operation of the device at these or any other conditions, above the parameters indicated in the operation listings of this specification, is not implied. 5.1 Absolute Maximum Ratings (See Note 1) Ambient temperature under bias...............................................................................................................-20°C to +70°C Storage temperature .............................................................................................................................. -40°C to +125°C Voltage on VDD with respect to VSS ......................................................................................................... -0.3V to +3.6V Voltage of any digital pin ............................................................................................................-0.3V to VDD + 0.3 ≤ 3.9 Maximum output current sunk by any I/O pin..........................................................................................................12 mA Maximum output current sourced by any I/O pin....................................................................................................12 mA Note 1: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions, above those indicated in the operation listings of this specification, is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. |
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