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AP0100CS 数据表(PDF) 20 Page - ON Semiconductor

部件名 AP0100CS
功能描述  High-Dynamic Range (HDR) Image Signal Processor (ISP)
PDF  73 Pages
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制造商  ONSEMI [ON Semiconductor]
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AP0100CS 数据表(HTML) 20 Page - ON Semiconductor

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AP0100CS HDR: Image Signal Processor (ISP)
Test Patterns
AP0100CS/D Rev. 6, Pub. 1/16 EN
20
©Semiconductor Components Industries, LLC,2016.
Test Patterns
The AP0100CS has a number of test patterns that are available when using the progres-
sive, NTSC and PAL modes. The test patterns can be selected by programming variables.
To enter test pattern mode, set R0xC88F to 0x02 and issue a Change-Config request; to
exit this mode, set R0xC88F to 0x00, and issue a Change-Config request.
NTSC and PAL test patterns can only be selected when the device is configured for inter-
laced operation.
Progressive Test Patterns
Figure 13:
Progressive Test Patterns
Test Pattern
Example
FLAT FIELD
REG= 0xC88C, 0x02
// CAM_MODE_SELECT
REG= 0xC88F, 0x01
// CAM_MODE_TEST_PATTERN_SELECT
REG= 0xC890, 0x000FFFFF
// CAM_MODE_TEST_PATTERN_RED
REG= 0xC894, 0x000FFFFF
// CAM_MODE_TEST_PATTERN_GREEN
REG= 0xC898, 0x000FFFFF
// CAM_MODE_TEST_PATTERN_BLUE
Load = Change-Config
Changing the values in R0xC890-R0x898 will change the color of the
test pattern (will require a Refresh operation).
100% Color Bar
REG= 0xC88C, 0x02
// CAM_MODE_SELECT
REG= 0xC88F, 0x02
// CAM_MODE_TEST_PATTERN_SELECT
Load = Change-Config
Pseudo-Random
REG= 0xC88C, 0x02
// CAM_MODE_SELECT
REG= 0xC88F, 0x05
// CAM_MODE_TEST_PATTERN_SELECT
Load = Change-Config
Linear Ramp
REG= 0xC88C, 0x02
// CAM_MODE_SELECT
REG= 0xC88F, 0x09
// CAM_MODE_TEST_PATTERN_SELECT
Load = Change-Config
Fade-to-Gray
REG= 0xC88C, 0x02
// CAM_MODE_SELECT
REG= 0xC88F, 0x08
// CAM_MODE_TEST_PATTERN_SELECT
Load = Change-Config



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