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SPC560P50L5 数据表(PDF) 93 Page - STMicroelectronics |
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SPC560P50L5 数据表(HTML) 93 Page - STMicroelectronics |
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93 / 112 page  SPC560P44Lx, SPC560P50Lx Electrical characteristics Doc ID 14723 Rev 9 93/112 Figure 25. Nexus output timing Figure 26. Nexus event trigger and test clock timings 6 tNTDIS CC D TDI data setup time 6 — — ns tNTMSS CC D TMS data setup time 6 — — ns 7 tNTDIH CC D TDI data hold time 10 — — ns tNTMSH CC D TMS data hold time 10 — — ns 8tTDOV CC D TCK low to TDO data valid — — 35 ns 9tTDOI CC D TCK low to TDO data invalid 6 — — ns 1. All Nexus timing relative to MCKO is measured from 50% of MCKO and 50% of the respective signal. 2. MDO, MSEO, and EVTO data is held valid until next MCKO low cycle. 3. Lower frequency is required to be fully compliant to standard. Table 40. Nexus debug port timing(1) (continued) No. Symbol C Parameter Value Unit Min Typ Max 1 3 4 MCKO MDO MSEO EVTO Output Data Valid 2 TCK 5 EVTI EVTO |
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