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MPF5024AMBA0ES 数据表(PDF) 78 Page - NXP Semiconductors

部件名 MPF5024AMBA0ES
功能描述  Power management integrated circuit (PMIC) for high performance applications
PDF  93 Pages
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制造商  NXP [NXP Semiconductors]
网页  http://www.nxp.com
标志 NXP - NXP Semiconductors

MPF5024AMBA0ES 数据表(HTML) 78 Page - NXP Semiconductors

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NXP Semiconductors
PF5024
Power management integrated circuit (PMIC) for high performance applications
PF5024
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2020. All rights reserved.
Product data sheet
Rev. 1 — 15 April 2020
78 / 93
17.3 Default hardwire configuration
If VDDOTP = V1P5D, the device loads the configuration from the default hardwire
configuration directly into the corresponding I2C functional registers each time the
registers need to be reloaded.
When using the hardwire configuration, the TRIM values are still loaded from the OTP
fuses. In the event of a TRIM loading failure, the corresponding fault flag is set to 1.
When the hardwire configuration is used, the PF5024 does not allow TBB mode
operation. When TBBEN = V1P5D, the device enters a debug mode. In this mode of
operation, the device ignores the default value of the LPM_OFF bit and moves into the
QPU_Off state, regardless of the result of the self-test. However, the actual result of the
self-test is notified by the STEST_NOK flag.
• When the self-test is successful, the STEST_NOK flag is set to 0
• When the self-test has failed, the STEST_NOK flag is set to 1
During hardwire configuration, the OTP_NOK flag is always set to 0.
When any of the TRIM_NOK, OTP_NOK or STEST_NOK flags are set, any PWRUP
event is ignored until the flags are cleared by writing a 0. These flags can only be written
when the system is in the debug mode, (TBBEN = V1P5D). In normal operation, the
TRIM_NOK, OTP_NOK and STEST_NOK flags are read only.



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