| 数据搜索系统,热门电子元器件搜索 |
|
MPF5024AMBA0ES 数据表(PDF) 13 Page - NXP Semiconductors |
|
|
|||||||||||||||||||||||||||||
MPF5024AMBA0ES 数据表(HTML) 13 Page - NXP Semiconductors |
|
13 / 93 page ![]() NXP Semiconductors PF5024 Power management integrated circuit (PMIC) for high performance applications PF5024 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2020. All rights reserved. Product data sheet Rev. 1 — 15 April 2020 13 / 93 • A CRC is performed on the mirror registers during the self-test routine, to ensure the integrity of the registers before powering up • ABIST test on all voltage monitors. To allow for varying settling times for the internal bandgap and clocks, the self-test block is executed up to three times (with 2.0 ms between each test) if a failure is encountered, the state machine proceeds to the fail-safe transition. A failure in the ABIST test is not interpreted as a self-test failure and it only sets the corresponding ABIST flag for system information. The MCU is responsible for reading the information and deciding whether it can continue with a safe operation. See Section 18.1 "System safety strategy" for the functional safety strategy of PF5024. Upon a successful self-test, the state machine proceeds to the QPU_Off state. 13.1.4 QPU_Off state The QPU_Off state is a higher power consumption Off mode, in which all internal circuitry required for a power on is biased and ready to start a power up sequence. If LPM_OFF = 1 and no turn on event is present, the device stops at the QPU_Off state, and waits until a valid turn on event is present. In this state, if VDDIO supply is provided externally, the device is able to communicate through I2C to access and modify the mirror registers in order to operate the device in TBB mode or to program the OTP registers as described in Section 17 "OTP/TBB and hardwire default configurations". If a power up event is started and any of the TRIM_NOK, OTP_NOK or STEST_NOK flags are asserted, the device ignores the power up event and remains in the QPU_Off state. See Section 17 "OTP/TBB and hardwire default configurations" for debugging a fuse loading failure. Upon a power up event, the default configuration from OTP or hardwire is loaded into their corresponding I2C functional register in the transition from QPU_Off to power up state. 13.1.5 Power up sequence During the power up sequence, the external regulators are turned on in a predefined order as programmed by the default (OTP or hardwire) sequence. The RESETBMCU is also programmed as part of the power up sequence, and it is used as the condition to enter the system On state. The RESETBMCU may be released in the middle of the power up sequence, in this case, the remaining supplies in the power up continues to power up as the device is in the run state. See Section 14.5.2 "Power up sequencing" for details. 13.1.6 System On state During the system On state, the MCU is powered and out of reset and the system is fully operational. The system On is a virtual state composed by two modes of operations: • Run state • Standby state |
|
链接网址 |
| ALLDATASHEET是否为您带来帮助? [ DONATE ] |
关于 Alldatasheet | 广告服务 | 联系我们 | 隐私政策 | 数据表链接 | 链接交换 | 制造商名单 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |