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AT25QL321 数据表(PDF) 66 Page - Dialog Semiconductor |
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AT25QL321 数据表(HTML) 66 Page - Dialog Semiconductor |
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66 / 79 page  65 AT25QL321 DS-25QL321–131C–5/2017 Notes: 1. Tested on sample basis and specified through design and characterization data, TA = 25˚C, VCC = 1.8V. 2. Checked Board Pattern. 8.7 AC Measurement Conditions Note: 1. Output Hi-Z is defined as the point where data out is no longer driven Current Read Data/ Dual/Quad 50MHz(2) ICC3 C=0.1 VCC / 0.9VCC 15 mA Current Read Data/ Dual/Quad 80MHz(2) ICC3 C=0.1 VCC / 0.9VCC 18 mA Current Read Data/ Dual/Quad 104MHz2) ICC3 C=0.1 VCC / 0.9VCC 20 mA Current Write Status Register ICC4 CS=VCC 10 20 mA Current page Program ICC5 CS=VCC 15 25 mA Current Block Erase ICC6 CS=VCC 15 25 mA Current Chip Erase ICC7 CS=VCC 15 25 mA Input Low Voltages VIL ‐0.5 VCC x0.2 V Input High Voltages VIH VCC x0.8 VCC +0.4 V Output Low Voltages VOL IOL= 100µA 0.2 V Output High Voltages VOH IOH=‐100µA VCC -0.2 V PARAMETER SYMBOL SPEC UNIT MIN MAX Load Capacitance CL 30 pF Input Rise and Fall Times TR, TF 5 ns Input Pulse Voltages VIN 0.2 VCC to 0.8 VCC V Input Timing Reference Voltages IN 0.3 VCC to 0.7 VCC V Output Timing Reference Voltages OUT 0.5 VCC to 0.5 VCC V |
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