19

AT49LL080

3273C–FLASH–5/03

Notes:

1. All specified voltages are with respect to GND. Minimum DC voltage on the V

2. Maximum DC voltage on V

3. Connection to supply of V

4. Do not violate processor or chipset limitations on the INIT pin.

Note:

1. This temperature requirement is different from the normal commercial operating condition of Flash memories.

Notes:

1. Input leakage currents include high-Z output leakage for all bi-directional buffers with tri-state outputs.

2. Refer to PCI spec.

3. Inputs are not “5-volt safe.”

4. I

5. Do not violate processor or chipset specifications regarding the INIT pin voltage.

Absolute Maximum Ratings*

Voltage on Any Pin

(except V

(1)(2)(4)

*NOTICE:

Stresses beyond those listed under “Absolute

Maximum Ratings” may cause permanent dam-

age to the device. This is a stress rating only and

functional operation of the device at these or any

other conditions beyond those indicated in the

operational sections of this specification is not

implied. Exposure to absolute maximum rating

conditions for extended periods may affect device

reliability.

V

(1)(2)(3)

Operating Conditions

Symbol

Parameter

Test Condition

Min

Max

Unit

Operating Temperature

(1)

Case Temperature

0

+85

° C

V

CC

V

3.0

3.6

V

LPC Interface DC Input/Output Specifications

Symbol

Parameter

Conditions

Min

Max

Units

V

IH

(3)

Input High Voltage

0.5 V

CC

V

V

V

(5)

INIT Input High Voltage

1.35

V

V

(5)

INIT Input Low Voltage

0.85

V

V

IL

(3)

Input Low Voltage

-0.5

0.3 V

CC

V

I

IL

(4)

Input Leakage Current

(1)

0 < V

±10

µA

Output High Voltage

V

V

OL

Output Low Voltage

I

0.1 V

CC

V

C

IN

Input Pin Capacitance

13

pF

CLK Pin Capacitance

3

12

pF

L

pin(2)

Recommended Pin Inductance

20

nH