ADIS16204SLASHPCBZ datasheet(4/24 Pages) AD

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ADIS16204

Rev. 0 | Page 4 of 24

Parameter

Conditions

Axis

Min

Typ

Max

Unit

LOGIC INPUTS3

Input High Voltage, VINH

2.0

Input Low Voltage, VINL

0.8

Logic 1 Input Current, IINH

VIH = VDD

±0.2

±1

μA

Logic 0 Input Current, IINL

VIL = 0 V

−40

−60

μA

Input Capacitance, CIN

DIGITAL OUTPUTS

Output High Voltage, VOH

ISOURCE = 1.6 mA

2.4

Output Low Voltage, VOL

ISINK = 1.6 mA

0.4

SLEEP TIMER

Timeout Period4

0.5

128

Seconds

START-UP TIME

Initial

130

Reset recovery

2.5

FLASH MEMORY

Endurance5

20,000

Cycles

Data Retention6

TJ = 85°C

Years

CONVERSION RATE

Maximum Throughput Rate

4096

SPS

Minimum Throughput Rate

2.066

SPS

POWER SUPPLY

Operating Voltage Range, VDD

3.0

3.3

3.6

Power Supply Current

Normal mode, SMPL_TIME ≥ 0x08

(fs ≤ 910 Hz), at 25°C

Fast mode, SMPL_TIME ≤ 0x07

(fs ≥ 1024 Hz), at 25°C

Sleep mode, at 25°C

150

μA

1 Note that gravity can impact this number, zero-g condition assumes both axes oriented normal to the earth’s gravity.

2 Self-test response changes as the square of VDD.

3 Note that the inputs are +5 V tolerant.

4 Guaranteed by design.

5 Endurance is qualified as per JEDEC Standard 22, Method A117 and measured at −40°C, +25°C, +85°C, and +105°C.

6 Retention lifetime equivalent at junction temperature (TJ), 55°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature.

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