STR910FAM32X6 datasheet(58/78 Pages) STMICROELECTRONICS

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Electrical characteristics

STR91xFA

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6.12.3 Absolute Maximum Ratings (Electrical Sensitivity)

Based on three different tests (ESD, LU and DLU) using specific measurement methods, the

product is stressed in order to determine its performance in terms of electrical sensitivity. For

more details, refer to the application note AN1181.

6.12.4 Electro-Static Discharge (ESD)

Electro-Static Discharges (3 positive then 3 negative pulses separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size

depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models can

be simulated: Human Body Model and Charge Device Model. This test conforms to the

JESD22-A114A/A115A standard.

Table 23.

ESD Absolute Maximum ratings

Notes:

Data based on characterization results, not tested in production.

6.12.5 Static and Dynamic Latch-Up

●

LU: 3 complementary static tests are required on 10 parts to assess the latch-up

performance. A supply overvoltage (applied to each power supply pin) and a current

injection (applied to each input, output and configurable I/O pin) are performed on each

sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details,

refer to the application note AN1181.

●

DLU: Electro-Static Discharges (one positive then one negative test) are applied to each

pin of 3 samples when the micro is running to assess the latch-up performance in dynamic

mode. Power supplies are set to the typical values, the oscillator is connected as near as

possible to the pins of the micro and the component is put in reset mode. This test

conforms to the IEC1000-4-2 and SAEJ1752/3 standards. For more details, refer to the

application note AN1181.

6.12.6 Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical

application environment and simplified MCU software. It should be noted that good EMC

performance is highly dependent on the user application and the software in particular.

Therefore it is recommended that the user applies EMC software optimization and

prequalification tests in relation with the EMC level requested for his application.

Software recommendations:

The software flowchart must include the management of runaway conditions such as:

●

Corrupted program counter

●

Unexpected reset

Symbol

Ratings

Conditions

Maximum

value 1)

Unit

VESD(HBM)

Electro-static discharge voltage

(Human Body Model)

TA=+25°C

+/-2000

VESD(CDM)

Electro-static discharge voltage

(Charge Device Model)

1000

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