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M69KB128AA 数据表(PDF) 41 Page - STMicroelectronics |
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M69KB128AA 数据表(HTML) 41 Page - STMicroelectronics |
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41 / 68 page ![]() M69KB128AA 9 DC and AC parameters 41/68 Table 16. DC Characteristics Symbol Parameter Refreshed Array Test Conditions Min. Typ. Max. Unit VOH (1) 1. BCR5-BCR4 = 01 (default settings). Output High Voltage IOH = –0.2mA 0.8VCCQ V VOL (1) Output Low Voltage IOL = 0.2mA 0.2VCCQ V VIH (2) 2. Input signals may overshoot to VCCQ+ 1.0V for periods of less than 2ns during transitions. Input High Voltage VCCQ–0.4 VCCQ + 0.2 V VIL (3) 3. Output signals may undershoot to VSS – 1.0V for periods of less than 2ns during transitions. Input Low Voltage –0.2 0.4 V ILI Input Leakage Current VIN = 0 to VCCQ 1µA ILO Output Leakage Current G = VIH or E = VIH 1µA ICC1 (4) 4. This parameter is specified with all outputs disabled to avoid external loading effects. The user must add the current required to drive output capacitance expected for the actual system. Asynchronous Read/Write Random at tRC min VIN = 0V or VCCQ, IOUT = 0mA, E = VIL 70ns 25 mA 85ns 22 mA ICC2 (4) Asynchronous Page Read VIN = 0V or VCCQ IOUT = 0mA, E = VIL 70ns 15 mA 85ns 12 mA ICC3 (4) Burst, Initial Read/Write Access VIN = 0V or VCCQ IOUT = 0mA, E = VIL 104MHz 35 mA 80MHz 30 mA 66MHz 25 mA ICC4R (4) Continuous Burst Read VIN = 0V or VCCQ IOUT = 0mA, E = VIL 104MHz 30 mA 80MHz 25 mA 66MHz 20 mA ICC4W (4) Continuous Burst Write VIN = 0V or VCCQ IOUT = 0mA, E = VIL 104MHz 35 mA 80MHz 30 mA 66MHz 25 mA IPASR (4) Partial Array Refresh Standby Current Full Array VIN = 0V or VCCQ E = VCCQ 200 µA 1/2 Array 170 µA 1/4 Array 155 µA 1/8 Array 150 µA None 140 µA ISB (5) 5. ISB maximum value is measured at +85°C with PAR set to Full Array. In order to achieve low standby current, all inputs must be driven either to VCCQ or VSSQ. ISB might be slightly higher for up to 500ms after Power-up, or when entering Standby mode. Standby Current VIN = 0V or VCCQ, E = VCCQ 200 µA ICCPD Deep-Power Down Current VIN = 0V or VCCQ, VCC, VCCQ = 1.95V; TA= +85°C 310 µA |
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