STM32F103C8 datasheet(29/67 Pages) STMICROELECTRONICS

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STM32F103xx

Electrical characteristics

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5.3.5

Supply current characteristics

The current consumption is measured as described in Figure 10: Current consumption

measurement scheme.

Maximum current consumption

The MCU is placed under the following conditions:

●

All I/O pins are in input mode with a static value at VDD or VSS (no load)

●

All peripherals are disabled except if it is explicitly mentioned

●

The Flash access time is adjusted to fHCLK frequency (0 wait state from 0 to 24 MHz, 1

wait state from 24 to 48 MHz and 2 wait states above)

The parameters given in Table 11 are derived from tests performed under ambient

temperature and VDD supply voltage conditions summarized in Table 7.

Table 11.

Maximum current consumption in Run and Sleep modes(1)

Symbol

Parameter

Conditions

FHCLK

Typ(2)

Max(3)

Unit

TA =

85 °C

TA=

105 °C

IDD

Supply

current in

Run mode

External clock with PLL, code running from

Flash, all peripherals enabled (see RCC

fPCLK1= fHCLK/2, fPCLK2 = fHCLK

72 MHz

TBD

48 MHz

TBD

36 MHz

TBD

24 MHz

TBD

External clock, PLL stopped, code running

from Flash, all peripherals enabled (see RCC

fPCLK1= fHCLK/2, fPCLK2 = fHCLK

8 MHz

TBD

External clock with PLL, code running from

RAM, all peripherals enabled (see RCC

fPCLK1= fHCLK/2, fPCLK2 = fHCLK

72 MHz

48 MHz

36 MHz

24 MHz

External clock, PLL stopped, code running

from RAM, all peripherals enabled (see RCC

fPCLK1= fHCLK/2, fPCLK2 = fHCLK

8 MHz

4.5

TBD

Supply

current in

Sleep mode

External clock with PLL, code running from

RAM or Flash, all peripherals enabled (see

RCC register description):

fPCLK1= fHCLK/2, fPCLK2 = fHCLK

72 MHz

48 MHz

36 MHz

24 MHz

External clock, PLL stopped, code running

from RAM or Flash, all peripherals enabled

(see RCC register description):

fPCLK1= fHCLK/2, fPCLK2 = fHCLK

8 MHz

3.5

TBD

TBD stands for to be determined.

Typical values are measured at TA = 25 °C, and VDD = 3.3 V

Data based on characterization results, tested in production at VDmax, fHCLK max. TAmax, and code executed from RAM.

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