STM32F103C8 datasheet(33/67 Pages) STMICROELECTRONICS

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5.3.6

External clock source characteristics

High-speed external user clock

The characteristics given in Table 15 result from tests performed using an high-speed

external clock source, and under ambient temperature and supply voltage conditions

summarized in Table 7.

Low-speed external user clock

The characteristics given in Table 16 result from tests performed using an low-speed

external clock source, and under ambient temperature and supply voltage conditions

summarized in Table 7.

Table 15.

High-speed external (HSE) user clock characteristics

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

fHSE_ext

User external clock source

frequency(1)

Value based on design simulation and/or technology characteristics. It is not tested in production.

825

MHz

VHSEH

OSC_IN input pin high level

voltage

0.7VDD

VDD

VHSEL

OSC_IN input pin low level

voltage

VSS

0.3VDD

tw(HSE)

OSC_IN high or low time(1)

tr(HSE)

tf(HSE)

OSC_IN rise or fall time(1)

OSC_IN Input leakage

current

VSS ≤VIN ≤VDD

±1

µA

Table 16.

Low-speed external user clock characteristics

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

fLSE_ext

User External clock source

frequency(1)

Value based on design simulation and/or technology characteristics. It is not tested in production.

32.768

1000

kHz

VLSEH

OSC32_IN input pin high level

voltage

0.7VDD

VDD

VLSEL

OSC32_IN input pin low level

voltage

VSS

0.3VDD

tw(LSE)

OSC32_IN high or low time(1)

450

tr(LSE)

tf(LSE)

OSC32_IN rise or fall time(1)

OSC32_IN Input leakage

current

VSS ≤VIN ≤VDD

±1

µA

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