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Table 2.36

A/D conversion characteristics for unit 0 (2 of 2)

Conditions: PCLKC = 1 to 50 MHz

Parameter

Min

Typ Max Unit Test conditions

High-precision normal-speed

channels

(AN003 to AN008, AN011 to

AN013)

Conversion time*1

(Operation at PCLKC =

50 MHz)

Permissible signal

source impedance

Max. = 1 kΩ

0.92 (0.66)*2 —

—

μs

Sampling in 33

states

Offset error

—

±1.0 ±2.5 LSB —

Full-scale error

—

±1.0 ±2.5 LSB —

Absolute accuracy

—

±2.0 ±4.5 LSB —

DNL differential nonlinearity error

—

±0.5 ±1.5 LSB —

INL integral nonlinearity error

—

±1.0 ±2.5 LSB —

Normal-precision normal-speed

channels (AN016)

Conversion time*1

(Operation at PCLKC =

50 MHz)

Permissible signal

source impedance

Max. = 1 kΩ

0.92 (0.66)*2 —

—

μs

Sampling in 33

states

Offset error

—

±1.0 ±5.5 LSB —

Full-scale error

—

±1.0 ±5.5 LSB —

Absolute accuracy

—

±2.0 ±7.5 LSB —

DNL differential nonlinearity error

—

±0.5 ±4.5 LSB —

INL integral nonlinearity error

—

±1.0 ±5.5 LSB —

Note:

These specification values apply when there is no access to the external memory during A/D conversion. If access occurs during

A/D conversion, values might not fall within the indicated ranges.

The use of PORT0 as digital outputs is not allowed when the 12-Bit A/D converter is used.

The characteristics apply when AVCC0, AVSS0, VREFH0, VREFL0, and 12-bit A/D converter input voltage are stable.

Note 1. The conversion time includes the sampling and comparison times. The number of sampling states is indicated for the test

conditions.

Note 2. Values in parentheses indicate the sampling time.

Table 2.37

A/D internal reference voltage characteristics

Parameter

Min

Typ

Max

Unit

Test conditions

A/D internal reference voltage

1.13

1.18

1.23

—

Sampling time

4.15

—

µs

—

RA4M2 Datasheet

2. Electrical Characteristics

R01DS0367EJ0140 Rev.1.40

May 9, 2025

Page 66 of 93

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