AD8363ACPZ-R7 datasheet(29/36 Pages) AD

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AD8363

Rev. 0 | Page 29 of 36

DESCRIPTION OF RF CHARACTERIZATION

A voltmeter measured the subsequent response to the stimulus,

and the results were stored in a database for later analysis. In this

way, multiple AD8363 devices were characterized over amplitude,

frequency, and temperature in a minimum amount of time.

The general hardware configuration used for most of the AD8363

characterization is shown in Figure 68. The AD8363 was driven

in a single-ended configuration for all characterization.

The RF stimulus amplitude was calibrated up to the connector

of the circuit board that carries the AD8363. However, the

calibration does not account for the slight losses due to the

connector and the traces from the connector to the device

under test. For this reason, there is a small absolute amplitude

error (<0.5 dB) not accounted for in the characterization data.

Characterization of the AD8363 employed a multisite test

strategy. Several AD8363 devices mounted on circuit boards

constructed with Rogers 3006 material was simultaneously

inserted into a remotely-controlled thermal test chamber.

A Keithley S46 RF switching network connected an Agilent

E8251A signal source to the appropriate device under test. An

Agilent 34980A switch matrix provided switching of dc power

and metering for the test sites. A PC running Agilent VEE Pro

controlled the signal source, switching, and chamber temperature.

This implies a slight error in the reported intercept; however,

this is generally not important because the slope and the relative

accuracy of the AD8363 are not affected.

The typical performance data was derived with CLPF = 3.9 nF

and CHPF = 2.7 nF with a CW waveform.

AD8363

CHARACTERIZATION

BOARD – TEST SITE 1

AD8363

CHARACTERIZATION

BOARD – TEST SITE 2

KEITHLEY S46

MICROWAVE

SWITCH

AGILENT E8251A

MICROWAVE

SIGNAL

GENERATOR

AGILENT 34980A

SWITCH MATRIX/

DC METER

AGILENT E3631A

DC POWER

SUPPLIES

PERSONAL

COMPUTER

AD8363

CHARACTERIZATION

BOARD – TEST SITE 3

DATA AND CONTROL

Figure 68. General RF Characterization Configuration

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