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ADCLK846/PCBZ 数据表(PDF) 4 Page - Analog Devices

部件名 ADCLK846/PCBZ
功能描述  1.8 V, 6 LVDS/12 CMOS Outputs Low Power Clock Fanout Buffer
PDF  16 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADCLK846/PCBZ 数据表(HTML) 4 Page - Analog Devices

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ADCLK846
Rev. A | Page 4 of 16
TIMING CHARACTERISTICS
Table 2.
Parameter
Symbol
Min
Typ
Max
Unit
Conditions
LVDS OUTPUTS
Termination = 100 Ω differential; 3.5 mA
Output Rise/Fall Time
tR, tF
135
235
ps
20% to 80% measured differentially
Propagation Delay, CLK-to-LVDS Output
tPD
1.5
2.0
2.7
ns
VICM = VREF, VID = 0.5 V
Temperature Coefficient
2.0
ps/°C
Output Skew1
All LVDS Outputs on the Same Part
65
ps
All LVDS Outputs Across Multiple Parts
390
ps
Additive Time Jitter
Integrated Random Jitter
54
fs rms
BW = 12 kHz to 20 MHz, CLK = 1000 MHz
74
fs rms
BW = 50 kHz to 80 MHz, CLK = 1000 MHz
86
fs rms
BW = 12 kHz to 20 MHz, CLK = 1000 MHz
Broadband Random Jitter2
150
fs rms
Input slew rate = 1 V/ns
Crosstalk-Induced Jitter
260
fs rms
Calculated from spur energy with an interferer
10 MHz offset from carrier
CMOS OUTPUTS
Termination = open
Output Rise/Fall Time
tR, tF
525
950
ps
20% to 80%; CMOS load = 10 pF
Propagation Delay, CLK-to-CMOS Output
tPD
2.5
3.2
4.2
ns
10 pF load
Temperature Coefficient
2.2
ps/°C
Output Skew2
All CMOS Outputs on the Same Part
175
ps
All CMOS Outputs Across Multiple Parts
640
ps
Additive Time Jitter
Integrated Random Jitter
56
fs rms
BW = 12 kHz to 20 MHz, CLK = 200 MHz
Broadband Random Jitter3
100
fs rms
Input slew = 2 V/ns; see Figure 11
Crosstalk-Induced Jitter
260
fs rms
Calculated from spur energy with an interferer
10 MHz offset from carrier
LVDS-TO-CMOS OUTPUT SKEW2
LVDS Output(s) and CMOS Output(s)
on the Same Part
0.8
1.6
ns
CMOS load = 10 pF and LVDS load = 100 Ω
1 This is the difference between any two similar delay paths while operating at the same voltage and temperature.
2 Measured at rising edge of clock signal.
3 Calculated from SNR of ADC method.



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