STM32F107VC datasheet(74/95 Pages) STMICROELECTRONICS

74 / 95 page

Electrical characteristics

STM32F105xx, STM32F107xx

74/95

Doc ID 15274 Rev 4

Figure 33.

12-bit buffered /non-buffered DAC

1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly

without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the

DAC_CR register.

Offset(2)

Offset error

(difference between

measured value at Code

(0x800) and the ideal value =

VREF+/2)

±10

Given for the DAC in 12-bit

configuration

±3

LSB

Given for the DAC in 10-bit at

VREF+ = 3.6 V

±12

LSB

Given for the DAC in 12-bit at

VREF+ = 3.6 V

Gain

error(2)

Gain error

±0.5

Given for the DAC in 12bit

configuration

tSETTLING

(2)

Settling time (full scale: for a

10-bit input code transition

between the lowest and the

highest input codes when

DAC_OUT reaches final

value ±1LSB

µs

CLOAD

50 pF,

RLOAD 5 kY

Update

rate(2)

Max frequency for a correct

DAC_OUT change when

small variation in the input

code (from code i to i+1LSB)

1MS/s

CLOAD

50 pF,

RLOAD 5 kY

tWAKEUP

(2)

Wakeup time from off state

(Setting the ENx bit in the

DAC Control register)

6.5

µs

CLOAD

50 pF, RLOAD 5 kY

input code between lowest and

highest possible ones.

PSRR+ (1)

Power supply rejection ratio

(to VDDA) (static DC

measurement

–67

–40

No RLOAD, CLOAD = 50 pF

1. Guaranteed by design, not tested in production.

2. Guaranteed by characterization, not tested in production.

Table 55.

DAC characteristics (continued)

Symbol

Parameter

Min

Typ

Max

Unit

Comments

R LOAD

C LOAD

Buffered/Non-buffered DAC

DACx_OUT

Buffer(1)

12-bit

digital to

analog

converter

ai17157

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