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DAC5687MPZPEP 数据表(PDF) 21 Page - Texas Instruments

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部件名 DAC5687MPZPEP
功能描述  16-BIT 500-MSPS 2쨈??쨈 INTERPOLATING DUAL-CHANNEL DIGITAL-TO-ANALOG CONVERTER (DAC)
PDF  75 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

DAC5687MPZPEP 数据表(HTML) 21 Page - Texas Instruments

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CLK1
CLK1C
PLLLOCK
IOGND
IOVDD
RESETB
EXTIO
EXTLO
BIASJ
IOUTA1
IOUTA2
IOUTB1
IOUTB2
TxENABLE
DA[15:0]
DB[15:0]
CEXTIO
0.1
µF
RBIAS
1 k
3.3 V
3.3 V
100
HP8665B
Synthesized
Signal
Generator
1:4
Mini Circuits
TCM4−1W
200
0.01
µF
16
Agilent 16702B
Mainframe System
With
16720A Pattern
Generator Card
Rohde & Schwarz
FSQ8
Spectrum
Analyzer
PULSE
FREQ. = fdata
93.1
0.033
µF
330 pF
Agilent 8133A
Pulse Generator
CLK2
CLK2C
1.8 V/2.1 V
10
10 pF
3.3 V
16
PULSE
FREQ. = fdata
Ampl. = 1 VPP
1:4
Mini Circuits
T4−1
3.3 V
3.3 V
100
3.3 V
Sinusoid
FREQ. = fdata
B0039-02
3.3 V
DAC5687-EP
SGLS333 – JUNE 2006
Test Methodology (continued)
Figure 28. DAC5687 Test Configuration for PLL Clock Mode
WCDMA Test Model 1 test vectors for the DAC5687 characterization were generated in accordance with the
3GPP Technical Specification . Chip rate data was generated using the Test Model 1 block in Agilent ADS. For
multicarrier signals, different random seeds and PN offsets were used for each carrier. A Matlab script
performed pulse shaping, interpolation to the DAC input data rate, frequency offsets, rounding and scaling. Each
test vector is 10 ms long, representing one frame. Special care is taken to assure that the end of file wraps
smoothly to the beginning of the file.
The cumulative complementary distribution function (CCDF) for the 1, 2, and 4 carrier test vectors is shown in
Figure 29. The test vectors are scaled such that the absolute maximum data point is 0.95 (–0.45 dB) of full
scale. No peak reduction is used.
21
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