DAC5687MPZPEP datasheet(5/75 Pages) TI1

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ABSOLUTE MAXIMUM RATINGS

DAC5687-EP

SGLS333 – JUNE 2006

TERMINAL FUNCTIONS (continued)

TERMINAL

I/O

DESCRIPTION

NAME

NO.

SLEEP

Asynchronous hardware power-down input. Active high. Internal pulldown.

TXENABLE has two purposes. In all modes, TXENABLE must be high for the DATA to the DAC to

be enabled. When TXENABLE is low, the digital logic section is forced to all 0, and any input data

presented to DA[15:0] and DB[15:0] is ignored. In interleaved data mode, when the qflag register

TXENABLE

bit is cleared, TXENABLE is used to synchronizes the data to channels A and B. The first data

after the rising edge of TXENABLE is treated as A data, while the next data is treated as B data,

and so on.

TESTMODE

TESTMODE is DGND for the user.

over operating free-air temperature range (unless otherwise noted)(1)

UNIT

AVDD(2)

–0.5 V to 4 V

DVDD(3)

–0.5 V to 2.3 V

Supply voltage range

CLKVDD(2)

–0.5 V to 4 V

IOVDD(2)

–0.5 V to 4 V

PLLVDD(2)

–0.5 V to 4 V

Voltage between AGND, DGND, CLKGND, PLLGND, and IOGND

–0.5 V to 0.5 V

AVDD to DVDD

–0.5 V to 2.6 V

DA[15..0](4)

–0.5 V to IOVDD + 0.5 V

DB[15..0](4)

–0.5 V to IOVDD + 0.5 V

SLEEP(4)

–0.5 V to IOVDD + 0.5 V

CLK1/2, CLK1/2C(3)

–0.5 V to CLKVDD + 0.5 V

Supply voltage range

RESETB(4)

–0.5 V to IOVDD + 0.5 V

LPF(4)

–0.5 V to PLLVDD + 0.5 V

IOUT1, IOUT2(2)

–1 V to AVDD + 0.5 V

EXTIO, BIASJ(2)

–0.5 V to AVDD + 0.5 V

EXTLO(2)

–0.5 V to IAVDD + 0.5 V

Peak input current (any input)

20 mA

Peak total input current (all inputs)

30 mA

Operating free-air temperature range (DAC5687M)

–55°C to 125°C

Tstg

Storage temperature range

–65°C to 150°C

Lead temperature

1,6 mm (1/16 in) from the case for 10 s

260°C

(1)

Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings

only, and functional operation of these or any other conditions beyond those indicated under "recommended operating conditions" is not

implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

Measured with respect to AGND

(3)

Measured with respect to DGND

(4)

Measured with respect to IOGND

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