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数据搜索系统，热门电子元器件搜索 |
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STM8S207MB 数据表(PDF) 84 Page - STMicroelectronics |
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STM8S207MB 数据表(HTML) 84 Page - STMicroelectronics |
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84 / 103 page  Electrical characteristics STM8S207xx, STM8S208xx 84/103 Doc ID 14733 Rev 12 Figure 41. ADC accuracy characteristics 1. Example of an actual transfer curve. 2. The ideal transfer curve 3. End point correlation line ET = Total unadjusted error: maximum deviation between the actual and the ideal transfer curves. EO = Offset error: deviation between the first actual transition and the first ideal one. EG = Gain error: deviation between the last ideal transition and the last actual one. ED = Differential linearity error: maximum deviation between actual steps and the ideal one. EL = Integral linearity error: maximum deviation between any actual transition and the end point correlation line. Figure 42. Typical application with ADC EO EG 1LSBIDEAL 1LSB IDEAL V DDA V SSA – 1024 ----------------------------------------- = 1023 1022 1021 5 4 3 2 1 0 7 6 1 2 345 67 1021102210231024 (1) (2) ET ED EL (3) VDDA VSSA AINx STM8 VDD IL ±1µA VT 0.6V VT 0.6V CADC VAIN RAIN 10-bit A/D conversion CAIN |
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