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MAS6502 数据表(PDF) 9 Page - Micro Analog systems

部件名 MAS6502
功能描述  Piezoresistive Sensor
PDF  20 Pages
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制造商  MAS [Micro Analog systems]
网页  http://www.mas-oy.com
标志 MAS - Micro Analog systems

MAS6502 数据表(HTML) 9 Page - Micro Analog systems

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DA6502.008
29 November 2012
9 (20)
TEST AND TRIM CONTROL REGISTER
Pins
TE1
(output),
TE2
(input)
and
TE3
(input/output) are used for testing purposes. In
normal use these pins are left floating.
TE2=0: normal operation, (pull down resistor on
chip). TE1 is driven high.
TE2=1: the converter is in continuous integration
mode. The sigma - delta modulator latch output is
connected to the TE1 pin and TE1 is also
connected to the on-chip decimator input. This way
an external decimator can use the TE1 pin signal
and the results from the external and the on-chip
decimator can be compared.
Oscillator trimming: Test register REG37HEX bit 0
(MEASOSC) turns the oscillator on and connects
the oscillator output to the TE3 pin for frequency
measurement.
REG37HEX bit 2 (TRIMALLREG) is used for
oscillator trimming. When set to 1, the six least
significant bits OSCF(5:0) in REG38HEX are used to
adjust the oscillator frequency (see table 4). When
the right frequency is obtained the trim value can be
programmed to the EEPROM (address 40HEX). The
nominal frequency, 200kHz, is designed to occur
when OSCF(5:0) = 28HEX. Note: There is no need
for internal oscillator trimming since this is
done during wafer level testing.
If
TRIMALLREG=0 then data from
EEPROM
address 40HEX will be used to adjust the oscillator.
When bit 1 (EXTCLK) in test register REG37HEX is
set to 1 the internal oscillator is turned off and an
external clock signal can be connected to the TE3
pin. This enables the use of an external conversion
clock.
Test register REG37HEX bit 4 (ICLKDIV) enables
clock division, forcing the A/D conversion to run at
half the speed. Clock division is also used when an
external clock is used (EXTCLK bit is set).
Test register REG37HEX bit 3 (ISAMPL) enables
refreshing sensor sample only at every fourth clock
cycle for additional power saving but with increased
sampling noise level.
Table 3. MAS6502 test and trim control register (37HEX). Only bits (4:0) are used.
Bit Number
Bit Name
Description
Value
Function
7…5
X
-
4
ICLKDIV
Additional clock
division
0
1
100kHz/50kHz to SDM
50kHz/25kHz to SDM
3
ISAMPL
Sample refresh
mode selection
0
1
Refresh at every clock cycle
Refresh at fourth clock cycle
2
TRIMALLREG
Trim bits from
register
0
1
Normal operation
OSC trim register in use
1
EXTCLK
External clock mode
0
1
Normal operation
External clock from TE3
0
MEASOSC
Oscillator test mode
0
1
Normal operation
OSC output to TE3
X = Don’t care, SDM = Sigma delta modulator
Table 4. MAS6502 oscillator frequency control register (38HEX). Only bits (5:0) are used.
Bit Number
Bit Name
Description
Value
Function
7…6
X
-
5…0
OSCF
11111
00000
200kHz oscillator frequency
trimming value
X = Don’t care
Note: It is recommended to not change oscillator frequency trimming value since trimming is done during wafer level testing.



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