USB3503 datasheet(57/73 Pages) MICROCHIP

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DS00001584B-page 57

USB3503

In addition to defining the ESD tests, EN 61000-4-2 also categorizes the impact to equipment operation when the strike

occurs (ESD Result Classification). Both air discharge and contact discharge test techniques for applying stress condi-

tions are defined by the EN 61000-4-2 ESD document.

10.10.3

AIR DISCHARGE

To perform this test, a charged electrode is moved close to the system being tested until a spark is generated. This test

is difficult to reproduce because the discharge is influenced by such factors as humidity, the speed of approach of the

electrode, and construction of the test equipment.

10.10.4

CONTACT DISCHARGE

The uncharged electrode first contacts the pin to prepare this test, and then the probe tip is energized. This yields more

repeatable results, and is the preferred test method. The independent test laboratories contracted by Microchip provide

test results for both types of discharge methods.

10.11 AC Specifications

10.11.1

REFCLK

External Clock:50% duty cycle ± 10%, ± 350ppm, Jitter < 100ps rms.

10.11.2

SERIAL INTERFACE

The Hub conforms to AC specifications as set forth in the I2C Specification for Slave-Only devices.

10.11.3

USB 2.0

The Hub conforms to all voltage, power, and timing characteristics and specifications as set forth in the USB 2.0 Spec-

ification. Please refer to the USB 2.0 Specification which is available from the www.usb.org web site.

10.11.4

USB 2.0 HSIC

The upstream port of the HSIC Hub conforms to all voltage, power, and timing characteristics and specifications as set

forth in the High-Speed Inter-Chip USB Electrical Specification Version 1.0. Please refer to the USB 2.0 HSIC Specifi-

cation which is available from the www.usb.org web site.

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