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ADS5294IPFPR 数据表(PDF) 13 Page - Texas Instruments |
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ADS5294IPFPR 数据表(HTML) 13 Page - Texas Instruments |
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13 / 81 page  ADS5294 www.ti.com SLAS776D – NOVEMBER 2011 – REVISED SEPTEMBER 2015 8.7 Timing Requirements Typical values are at 25°C, AVDD = 1.8 V, LVDD = 1.8 V, sampling frequency = 80 MSPS, 14-bit, sine wave input clock = 1.5 Vpp clock amplitude, CLOAD = 5 pF, RLOAD = 100 Ω, unless otherwise noted. MIN and MAX values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD = 1.8 V, LVDD = 1.7 V to 1.9 V (1) (2) (3) MIN TYP MAX UNIT The delay in time between the rising edge of the input ta Aperture delay sampling clock and the actual time at which the sampling 4 ns occurs Aperture delay variation Across channels within the same device ±175 ps Across devices at the same temperature and LVDD supply 2.5 ns tj Aperture jitter RMS 320 fs rms Clock 1-wire LVDS output interface 11 cycles td Data latency Clock 2-wire LVDS output interface 15 cycles tSU Data set-up time 80 MSPS, 2-wire LVDS, 7x-serialization 0.34 0.57 ns tH Data hold time 80 MSPS, 2-wire LVDS, 7x-serialization 0.55 0.8 ns See LVDS Timing at Different Sampling Frequencies — 2-Wire Interface, 7x-Serialization, Digital Input clock rising edge (zero cross) to frame clock rising Clock propagation delay Filter Disabled and LVDS Timing at edge (zero cross) tPROP Different Sampling Frequencies — 1-Wire Interface, 14x-Serialization, Digital Filter Disabled Variation of tPROP Between two devices at same temperature and LVDD supply ±0.75 ns LVDS bit clock duty cycle 48% tRISE Data rise time Rise time is from –100 mV to + 100 mV, 10 ≤ Fs ≤ 80 MSPS 0.24 ns tFALL Data fall time Fall time is from +100 mV to –100 mV, 10 ≤ Fs ≤ 80 MSPS 0.24 ns tCLKRISE Output clock rise time Rise time is from –100 mV to +100 mV, 10 ≤ Fs ≤ 80 MSPS 0.20 ns tCLKFALL Output clock fall time Fall time is from +100 mV to –100 mV, 10 ≤ Fs ≤ 80 MSPS 0.20 ns Time to valid data after coming out of COMPLETE POWER- tWAKE Wake-up Time 100 µs DOWN mode Time to valid data after coming out of PARTIAL POWER- DOWN mode (with clock continuing to run during power- 5 µs down) (1) Timing parameters are ensured by design and characterization and not tested in production. (2) Measurements are done with a transmission line of 100- Ω characteristic impedance between the device and the load. Set-up and hold time specifications take into account the effect of jitter on the output data and clock. (3) Data valid refers to logic HIGH of 100 mV and logic LOW of –100 mV. Copyright © 2011–2015, Texas Instruments Incorporated Submit Documentation Feedback 13 Product Folder Links: ADS5294 |
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