MCP23017-ESLASHML datasheet(3/42 Pages) MICROCHIP

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DS20001952C-page 3

MCP23017/MCP23S17

1.0

ELECTRICAL CHARACTERISTICS

Absolute Maximum Ratings †

Ambient temperature under bias............................................................................................................. -40°C to +125°C

Storage temperature ............................................................................................................................... -65°C to +150°C

Voltage on VDD with respect to VSS .......................................................................................................... -0.3V to +5.5V

Voltage on all other pins with respect to VSS (except VDD)............................................................. -0.6V to (VDD + 0.6V)

Total power dissipation......................................................................................................................................... 700 mW

Maximum current out of VSS pin ...........................................................................................................................150 mA

Maximum current into VDD pin ..............................................................................................................................125 mA

Input clamp current, IIK (VI < 0 or VI > VDD)..........................................................................................................±20 mA

Output clamp current, IOK (VO < 0 or VO > VDD)...................................................................................................±20 mA

Maximum output current sunk by any output pin .................................................................................................... 25 mA

Maximum output current sourced by any output pin ...............................................................................................25 mA

ESD protection on all pins (HBM:MM) ..............................................................................................................4 kV:400V

† Notice: Stresses above those listed under “Maximum Ratings” may cause permanent damage to the device. This is

a stress rating only and functional operation of the device at those or any other conditions above those indicated in the

operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may

affect device reliability.

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