STM8AL3136 datasheet(101/124 Pages) STMICROELECTRONICS

101 / 124 page

DocID18474 Rev 7

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STM8AL313x/4x/6x STM8AL3L4x/6x

Electrical parameters

108

Sampling time

VAIN on PF0 fast

channel

VDDA < 2.4 V

0.43(4)(5)

µs

VAIN on PF0 fast

channel

2.4 V

≤VDDA≤ 3.6 V

0.22(4)(5)

VAIN on slow channels

VDDA < 2.4 V

0.86(4)(5)

VAIN on slow channels

2.4 V

≤VDDA≤ 3.6 V

0.41(4)(5)

tconv

12-bit conversion time

12000000 / fADC + tS

16 MHz

1(4)

tWKUP

Wakeup time from OFF

state

tIDLE(6)

Time before a new

conversion

∞

tVREFINT

Internal reference

voltage startup time

refer to

Table 49

1. The current consumption through VREF is composed of two parameters:

- one constant (max 300 µA)

- one variable (max 400 µA), only during sampling time + 2 first conversion pulses.

So, peak consumption is 300+400 = 700 µA and average consumption is 300 + [(4 sampling + 2) /16] x 400 = 450 µA at

1Msps

2. VREF- or VDDA must be tied to ground.

3. Guaranteed by design, not tested in production.

4. Minimum sampling and conversion time is reached for maximum Rext = 0.5 k

Ω..

5. Value obtained for continuous conversion on fast channel.

6. In STM8L05xx, STM8L15xx, STM8L162x, STM8AL31xx, STM8AL3Lxx, STM8AL31Exx and STM8AL3LExx MCU families

reference manual (RM0031), tIDLE defines the time between 2 conversions, or between ADC ON and the first conversion.

tIDLE is not relevant for this device.

Table 56. ADC1 characteristics (continued)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

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