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STSPIN32F0ATR 数据表(PDF) 30 Page - STMicroelectronics |
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STSPIN32F0ATR 数据表(HTML) 30 Page - STMicroelectronics |
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30 / 41 page ![]() Device description STSPIN32F0A 30/41 DocID030766 Rev 2.0 6.7 Test mode A dedicated pin TESTMODE is available to enter into the test mode. In the application, the TESTMODE pin should be shorted to GND in order not to enter the test mode inadvertently. 6.8 Operational amplifiers The device integrates three rail-to-rail operational amplifiers suitable for signal conditioning, in particular for current sensing. The operational amplifiers provide a rail-to-rail output stage with fast recovery in the saturation condition. The output stage saturation happens in linear applications when a high amplitude input signal occurs and causes the output of the operational amplifier to move outside its real capabilities. Figure 14: Operational amplifiers 6.9 Comparator A comparator is available to perform an overcurrent protection. The OC Comp pin can be connected to the shunt resistor to monitor the load current, the internal OC threshold can be set via MCU (PF6 and PF7 port, see Table 12: "OC threshold values"). When an OC event is triggered, the OC comparator output signals the OC event to the PB12 and PA12 inputs of MCU (BKIN and ETR). OP xP OPxO OP xN OPAMP To input ADC I NN I NP |
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