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MCP3564-E/ST 数据表(PDF) 32 Page - Microchip Technology |
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MCP3564-E/ST 数据表(HTML) 32 Page - Microchip Technology |
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32 / 108 page ![]() MCP3561/2/4 DS20006181C-page 32 2019-2021 Microchip Technology Inc. The possible selections are described in Table 5-1 and can be set with the MUX[7:0] register bits during the MUX mode. The MUX[7:4] bits define the selection for the VIN+ (noninverting analog input of the ADC). The MUX[3:0] bits define the selection for the VIN- (inverting analog input of the ADC). During SCAN mode, the two single-ended input multi- plexers are automatically set to a certain position, depending on the SCAN sequence and which channel has been selected by the user. The SCAN sequence channels’ configuration corresponds to a certain code in the MUX[7:0] register bits, as defined in Table 5-14. In order to monitor the digital power supply (DVDD), it is necessary to connect DVDD externally to one of the CHn analog inputs, since DVDD is not one of the pos- sible selections of the analog multiplexer. A similar setup can be implemented to monitor DGND if DGND is not connected externally to AGND. For MCP3561 and MCP3562, some codes are not available in the selection since the pins are not bonded out on these devices. These codes should then be avoided in the application, as the input they connect to is effectively a high-impedance node. The TEMP Diodes P and M are two internal diodes that are biased by a current source and that can be used to perform a temperature measurement. If TEMP Diode P is connected to VIN+ and TEMP Diode M to VIN-, then the ADC output code is a function of the temperature using Equation 5-1 (see Section 5.1.2 “Internal Tem- perature Sensor” for more details). The VCM selection measures the internal Common-mode voltage source that biases the Delta-Sigma modulator (this voltage is not provided at any output of the part). The possible inputs of the analog multiplexer include, not only the analog input channels, but also REFIN+/- inputs, AVDD and AGND, as well as temperature sensor outputs and the VCM internal Common-mode. This large selection offers many possibilities for measuring internal or external data resources of the system and can serve as diagnostic purposes to increase the security of the applications. Some monitor channels are already predefined in SCAN mode to further help users to integrate diagnostics to their applications (for example, the analog power supply or the temperature can be constantly monitored in SCAN mode, see Section 5.14.3 “SCAN Mode Internal Resource Channels” for more details of the different resources that can be monitored in SCAN mode). TABLE 5-1: ANALOG INPUT MUX DECODING MUX[7:4] (VIN+) or MUX[3:0] (VIN-) Code Selected Channel Comment 0000 CH0 0001 CH1 0010 CH2 Not Connected (NC) for MCP3561 0011 CH3 Not Connected (NC) for MCP3561 0100 CH4 Not Connected (NC) for MCP3561/2 0101 CH5 Not Connected (NC) for MCP3561/2 0110 CH6 Not Connected (NC) for MCP3561/2 0111 CH7 Not Connected (NC) for MCP3561/2 1000 AGND 1001 AVDD 1010 Reserved Do not use 1011 REFIN+ 1100 REFIN- 1101 TEMP Diode P 1110 TEMP Diode M 1111 Internal VCM Internal Common-mode voltage for modulator biasing |
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