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STM32U545NET6QTR 数据表(PDF) 257 Page - STMicroelectronics |
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STM32U545NET6QTR 数据表(HTML) 257 Page - STMicroelectronics |
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257 / 283 page ![]() DS14216 Rev 1 257/283 STM32U545xx Electrical characteristics 258 5.3.37 USB_FS characteristics 5.3.38 JTAG/SWD interface characteristics Unless otherwise specified, the parameters given in the tables below are derived from tests performed under the ambient temperature, fHCLKx frequency and VDD supply voltage conditions summarized in Table 33, with the following configuration: • Output speed set to OSPEEDRy[1:0] = 10 • Capacitive load CL = 30 pF • Measurement points done at 0.5 × VDD level Refer to Section 5.3.14: I/O port characteristics for more details on the input/output characteristics. Table 131. USB_FS characteristics Symbol Parameter Conditions Min Typ Max Unit VDDUSB USB transceiver operating supply voltage - 3.0(1) -3.6 V RPUI Embedded USB_DP pullup value during idle - 900 - 1575 Ω RPUR Embedded USB_DP pullup value during reception - 1425 - 3090 ZDRV Output driver impedance(2) High and low driver 28 36 44 1. USB functionality is ensured down to 2.7 V, but some USB electrical characteristics are degraded in 2.7 to 3.0 V range. 2. No external termination series resistors are required on USB_DP (D+) and USB_DM (D-). The matching impedance is already included in the embedded driver. Table 132. JTAG characteristics(1) Symbol Parameter Conditions Min Typ Max Unit FTCK TCK clock frequency 2.7 V ≤ VDD ≤ 3.6 V - - 38 MHz 1.71 V ≤ VDD ≤ 3.6 V - - 26 tisu(TMS) TMS input setup time - 1 - - ns tih(TMS) TMS input hold time - 3 - - tisu(TDI) TDI input setup time - 2 - - tih(TDI) TDI input hold time - 1 - - tov(TDO) TDO output valid time 2.7 V ≤ VDD ≤ 3.6 V - 9 13 ns 1.71 V ≤ VDD ≤ 3.6 V - 9 19 toh(TDO) TDO output hold time - 7 - - 1. Evaluated by characterization. Not tested in production. Table 133. SWD characteristics(1) Symbol Parameter Conditions Min Typ Max Unit FSWCLK SWCLK clock frequency 2.7 V ≤ VDD ≤ 3.6 V - - 66.5 MHz 1.71 V ≤ VDD ≤ 3.6 V - - 43 |
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