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ST10F272M 数据表(PDF) 132 Page - STMicroelectronics |
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ST10F272M 数据表(HTML) 132 Page - STMicroelectronics |
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132 / 175 page ![]() Electrical characteristics ST10F272M 132/176 24.7.1 Conversion timing control When a conversion is started, first the capacitances of the converter are loaded via the respective analog input pin to the current analog input voltage. The time to load the capacitances is referred to as sample time. Next the sampled voltage is converted to a digital value several successive steps, which correspond to the 10-bit resolution of the ADC. During these steps the internal capacitances are repeatedly charged and discharged via the VAREF pin. The current that has to be drawn from the sources for sampling and changing charges depends on the time that each respective step takes, because the capacitors must reach their final voltage level within the given time, at least with a certain approximation. The maximum current, however, that a source can deliver, depends on its internal resistance. The time that the two different actions during conversion take (sampling, and converting) can be programmed within a certain range in the ST10F272M relative to the CPU clock. The absolute time that is consumed by the different conversion steps therefore is independent from the general speed of the controller. This allows adjustment of the ST10F272M A/D converter to the system’s properties: Analog Switch Resistance(3)(8) RSW CC – – 600 1600 W Port5 Port1 RAD CC – 1300 W 1. VAREF can be tied to ground when A/D Converter is not in use: There is increased consumption (approximately 200µA) on main VDD due to internal analog circuitry not being completely turned off. Therefore, it is suggested to maintain the VAREF at VDD level even when not in use, and to eventually switch off the A/D Converter circuitry setting bit ADOFF in ADCON register. 2. VAIN may exceed VAGND or VAREF up to the absolute maximum ratings. However, the conversion result in these cases will be 0x000H or 0x3FFH, respectively 3. Not 100% tested, guaranteed by design characterization 4. During the sample time the input capacitance CAIN can be charged/discharged by the external source. The internal resistance of the analog source must allow the capacitance to reach its final voltage level within tS. After the end of the sample time tS, changes of the analog input voltage have no effect on the conversion result. Values for the sample clock tS depend on programming and can be taken from Table 60: A/D converter programming. 5. This parameter includes the sample time tS, the time for determining the digital result and the time to load the result register with the conversion result. Values for the conversion clock tCC depend on programming and can be taken from the next Table 60. 6. DNL, INL, OFS and TUE are tested at VAREF = 5.0V, VAGND = 0V, VDD = 5.0V. It is guaranteed by design characterization for all other voltages within the defined voltage range. ‘LSB’ has a value of VAREF/1024. For Port5 channels, the specified TUE (± 2LSB) is guaranteed also with an overload condition (see IOV specification) occurring on maximum 2 not selected analog input pins of Port5 and the absolute sum of input overload currents on all Port5 analog input pins does not exceed 10mA. For Port1 channels, the specified TUE is guaranteed when no overload condition is applied to Port1 pins: when an overload condition occurs on maximum 2 not selected analog input pins of Port1 and the input positive overload current on all analog input pins does not exceed 10mA (either dynamic or static injection), the specified TUE is degraded (± 7LSB). To obtain the same accuracy, the negative injection current on Port1 pins must not exceed -1mA in case of both dynamic and static injection. 7. The coupling factor is measured on a channel while an overload condition occurs on the adjacent not selected channels with the overload current within the different specified ranges (for both positive and negative injection current). 8. Refer to scheme shown in Figure 40. Table 59. A/D converter characteristics (continued) Parameter Symbol Limit values Unit Test condition Min Max |
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