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M41T82 数据表(PDF) 29 Page - STMicroelectronics |
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M41T82 数据表(HTML) 29 Page - STMicroelectronics |
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29 / 61 page ![]() M41T82-M41T83 Clock operation Doc ID 12578 Rev 12 29/61 3.4.2 Analog calibration (programmable load capacitance) A second method of calibration employs the use of programmable internal load capacitors to adjust (or trim) the oscillator frequency. As discussed in Section 3.4.1, the 512 Hz frequency test output can be used to determine the amount of frequency error in the oscillator. Changes in the analog calibration value will affect the frequency test output, thus the user can immediately see the effects of these changes (see Section 3.14 on page 41 for more information on enabling the FT output). By design, the oscillator is intended to be 0 ppm ± crystal accuracy at room temperature (25 °C, see Figure 17 on page 30). For a 12.5 pF crystal, the default loading on each side of the crystal will be 25 pF. For incrementing or decrementing the calibration value, capacitance will be added or removed in increments of 0.25 pF to each side of the crystal. Internally, CLOAD of the oscillator is changed via two digitally controlled capacitors, CXI and CXO, connected from the XI and XO pins to ground (see Figure 16 on page 25). The effective on-chip series load capacitance, CLOAD, ranges from 3.5 pF to 17.4 pF, with a nominal value of 12.5 pF (AC0 – AC6 = 0). The effective series load capacitance (CLOAD) is the combination of CXI and CXO: Seven analog calibration bits, AC0 to AC6, are provided in order to adjust the on-chip load capacitance value for frequency compensation of the RTC. Each bit has a different weight for capacitance adjustment. An analog calibration sign (ACS) bit determines if capacitance is added (ACS bit = 0, negative calibration) or removed (ACS bit = 1, positive calibration). The majority of the calibration adjustment is positive (i.e. to increase the oscillator frequency by removing capacitance) due to the typical characteristic of quartz crystals to slow down due to changes in temperature, but negative calibration is also available. Since the analog calibration register adjustment is essentially pulling the frequency of the oscillator, the resulting frequency changes will not be linear with incremental capacitance changes. The equations which govern this mechanism indicate that smaller capacitor values of analog calibration adjustment will provide larger increments. Thus, the larger values of analog calibration adjustment will produce smaller incremental frequency changes. These values typically vary from 6-10 ppm/bit at the low end to <1 ppm/bit at the highest capacitance settings. The range provided by the analog calibration register adjustment with a typical surface mount crystal is approximately ±30 ppm around the AC6-AC0 = 0 default setting because of this property (see Table 7 on page 30). Pre-programmed calibration value Users of the M41T83 in the embedded crystal package have the option of using the factory programmed analog calibration value (refer to Section 3.17: OTP bit operation (M41T83 in SOX18 package only) on page 45). C LOAD 11 C XI ⁄ 1C XO ⁄ + () ⁄ = |
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