MPC5601DXLL datasheet(44/77 Pages) FREESCALE

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MPC5602D Microcontroller Data Sheet, Rev. 3.1

Preliminary—Subject to Change Without Notice

Electrical characteristics

Freescale Semiconductor

4.12.1

Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical application environment and simplified

MCU software. It should be noted that good EMC performance is highly dependent on the user application and the software in

particular.

Therefore it is recommended that the user apply EMC software optimization and prequalification tests in relation with the EMC

level requested for his application.

•

Software recommendations

The software flowchart must include the management of runaway conditions such as:

— Corrupted program counter

— Unexpected reset

— Critical data corruption (control registers...)

•

Prequalification trials

Most of the common failures (unexpected reset and program counter corruption) can be

reproduced by manually forcing a low state on the reset pin or the oscillator pins for 1 second.

To complete these trials, ESD stress can be applied directly on the device. When unexpected behavior is detected, the

software can be hardened to prevent unrecoverable errors occurring.

4.12.2

Electromagnetic interference (EMI)

The product is monitored in terms of emission based on a typical application. This emission test conforms to the IEC 61967-1

standard, which specifies the general conditions for EMI measurements.

4.12.3

Absolute maximum ratings (electrical sensitivity)

Based on two different tests (ESD and LU) using specific measurement methods, the product is stressed in order to determine

its performance in terms of electrical sensitivity.

4.12.3.1

Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according

to each pin combination. The sample size depends on the number of supply pins in the device (3 parts * (n + 1) supply pin).

This test conforms to the AEC-Q100-002/-003/-011 standard.

Table 29. EMI radiated emission measurement1,2

1 EMI testing and I/O port waveforms per IEC 61967-1, -2, -4

2 For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your

local marketing representative.

Symbol

Parameter

Conditions

Value

Unit

Min

Typ

Max

—

SR — Scan range

—

0.150

—

1000 MHz

fCPU SR — Operating frequency

—

MHz

VDD_LV SR — LV operating voltages

—

1.28

—

SEMI CC T Peak level

VDD = 5 V, TA =25°C,

100 LQFP package

Test conforming to IEC 61967-2,

fOSC = 8 MHz/fCPU = 48 MHz

No PLL frequency

modulation

——

TBD dBµV

± 2% PLL frequency

modulation

——

TBD3

3 All values need to be confirmed during device validation

dBµV

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