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MPC5601DXLL 数据表(PDF) 59 Page - Freescale Semiconductor, Inc |
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MPC5601DXLL 数据表(HTML) 59 Page - Freescale Semiconductor, Inc |
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59 / 77 page ![]() Electrical characteristics MPC5602D Microcontroller Data Sheet, Rev. 3.1 Preliminary—Subject to Change Without Notice Freescale Semiconductor 59 DNL CC T Absolute Differential non-linearity No overload —0.5 1 LSB OFS CC T Absolute Offset error — —2 — LSB GNE CC T Absolute Gain error — —2 — LSB TUEP7 CC P Total unadjusted error for precise channels, input only pins Without current injection –6 6 LSB T With current injection –8 8 TUEX7 CC T Total unadjusted error for extended channel Without current injection –10 10 LSB T With current injection –12 12 1 V DD = 3.3 V ± 10% / 5.0 V ± 10%, TA = 40 to 125 °C, unless otherwise specified. 2 Analog and digital V SS must be common (to be tied together externally). 3 V AINx may exceed VSS_ADC and VDD_ADC limits, remaining on absolute maximum ratings, but the results of the conversion will be clamped respectively to 0x000 or 0xFFF. 4 Duty cycle is ensured by using system clock without prescaling. When ADCLKSEL = 0, the duty cycle is ensured by internal divider by 2. 5 During the sample time the input capacitance C S can be charged/discharged by the external source. The internal resistance of the analog source must allow the capacitance to reach its final voltage level within tADC_S. After the end of the sample time tADC_S, changes of the analog input voltage have no effect on the conversion result. Values for the sample clock tADC_S depend on programming. 6 This parameter does not include the sample time t ADC_S, but only the time for determining the digital result and the time to load the result’s register with the conversion result. 7 Total Unadjusted Error: The maximum error that occurs without adjusting Offset and Gain errors. This error is a combination of Offset, Gain and Integral Linearity errors. Table 38. ADC conversion characteristics (continued) Symbol C Parameter Conditions1 Value Unit Min Typ Max |
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