MPC5601DXLL datasheet(45/77 Pages) FREESCALE

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Electrical characteristics

MPC5602D Microcontroller Data Sheet, Rev. 3.1

Preliminary—Subject to Change Without Notice

Freescale Semiconductor

4.12.3.2

Static latch-up (LU)

Two complementary static tests are required on six parts to assess the latch-up performance:

•

A supply overvoltage is applied to each power supply pin.

•

A current injection is applied to each input, output and configurable I/O pin.

These tests are compliant with the EIA/JESD 78 IC latch-up standard.

4.13

Fast external crystal oscillator (4 to 16 MHz) electrical

characteristics

The device provides an oscillator/resonator driver. Figure 9 describes a simple model of the internal oscillator driver and

provides an example of a connection for an oscillator or a resonator.

Table 30. ESD absolute maximum ratings1 2

1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated

Circuits.

2 A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device

specification requirements. Complete DC parametric and functional testing shall be performed per applicable

device specification at room temperature followed by hot temperature, unless specified otherwise in the device

specification.

Symbol

Ratings

Conditions

Class

Max value

Unit

VESD(HBM) CC T Electrostatic discharge voltage

(Human Body Model)

TA = 25 °C

conforming to AEC-Q100-002

H1C

2000

VESD(MM) CC T Electrostatic discharge voltage

(Machine Model)

TA = 25 °C

conforming to AEC-Q100-003

200

VESD(CDM) CC T Electrostatic discharge voltage

(Charged Device Model)

TA = 25 °C

conforming to AEC-Q100-011

C3A

500

750 (corners)

Table 31. Latch-up results

Symbol

Parameter

Conditions

Class

T Static latch-up class

TA = 125 °C

conforming to JESD 78

II level A

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