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AT89C51ED2-RDTIM 数据表(PDF) 18 Page - ATMEL Corporation |
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AT89C51ED2-RDTIM 数据表(HTML) 18 Page - ATMEL Corporation |
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18 / 24 page  AT89C51RD2 / AT89C51ED2 QualPack 18 Rev. 0 – 2003 July 4.4 Device Reliability 4.4.1 Operating Life Testing AT89C51ED2 test results are summarized in the table below. Lot Device Type Test Description Step Result Comment A01948K AT89C51ED2 PLCC 44 EFR Dynamic Life Test 12h 48h 0/300 0/300 LFR Dynamic Life Test 500h 1000h 0/100 0/100 4.4.2 ESD / Latch-up AT89C51ED2 test results are summarized in the table below. Lot Device Type Test Description Step Result Comment A01948 AT89C51ED2 PLCC 44 ESD-HBM Model 2000V 3000V 4000V 5000V 0/3 1/3 1/3 1/3 Class 2 of MIL STD 883 LATCH-UP Over-Voltage Power Injection 5.5v 50mW 0/5 0/5 Test done at 125°C Classified latch-up free 4.4.3 FLASH and EEPROM Data Retention and Endurance Cycling AT89C51ED2 test results are summarized in the table below. Lot Device Type Test Description Step Result Comment A01948K AT89C51ED2 PLCC 44 Data Retention 500h 1000h 0/50 0/50 Program / Erase Endurance Cycling 100kc 0/30 32k USER memory Program / Erase Endurance Cycling 100kc 0/30 2k DATA memory |
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