AT89C51RD2 / AT89C51ED2 QualPack

20

Rev. 0 – 2003 July

4.4.4 AT89C51ED2 Operating Reliability Calculation

In the next table, it is proposed a AT89C51ED2 reliability prediction calculated at 55°c for 60% confidence level

from generic test data collected over the 12 last months process monitor.

Lots

Device Type

Test Description

Step

Result

Comment

A00648

P01709

A00988B

T89C51CC01

VQFP 44

EFR Dynamic Life Test

48h

0/3787

A01459A

A01460E

A01615B

LFR Dynamic Life Test

1000h

0/266

A01110C

A01110D

T89C51CC02

SOIC28

EFR Dynamic Life Test

48h

1/1260

1 Ipd drift caused by scratch on

metal 1

A01185F

A01366E

LFR Dynamic Life Test

1000h

0/280

A01679A

A01679B

T89C51RC2

PLCC 44

EFR Dynamic Life Test

48h

0/1856

LFR Dynamic Life Test

1000h

0/100

A00808A

A00943E

T89C51RB2

PLCC 44

EFR Dynamic Life Test

48h

0/300

LFR Dynamic Life Test

1000h

0/100

A01487Q

A02179

T85C5121

T89C5121

EFR Dynamic Life Test

48h

0/684

SSOP24

LFR Dynamic Life Test

1000h

0/100

A01435H

A01435K

AT89C5114

SOIC20

EFR Dynamic Life Test

48h

0/1887

A02293C

LFR Dynamic Life Test

1000h

0/200

A00960C

A01808A

AT89C51SND1

AT83C51SND1

EFR Dynamic Life Test

48h

1/550

Consumption hot spot in DCLK

input buffer

A01914J

VQFP 80

LFR Dynamic Life Test

1000h

0/170

A01584A

AT89C5131

VQFP64

EFR Dynamic Life Test

48h

0/350

LFR Dynamic Life Test

1000h

0/100

Global

EFR Dynamic Life Test

48h

2/10674 187 ppm

LFR Dynamic Life Test

-

0/1316

4.4 fit