AT89C51ED2-RDTIM datasheet(19/24 Pages) ATMEL

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AT89C51RD2 / AT89C51ED2 QualPack

Rev. 0 – 2003 July

AT56800 Program / Erase Endurance:

Temperature acceleration factor calculation:

010000 30000 50000 70000 90000 110000

Number of cycles

LEGEND

Normal (94541;13074)

Weibull (100021;8,97;0)

fail Count

A01110-125dEndurance

16K FLASH Program Erase Endurance: Typical 125d distribution

Endurance Temperature Acceleration

T89C51CC02 - A01013L

1076331

94415

1,0E+03

1,0E+04

1,0E+05

1,0E+06

1,0E+07

25°C

125°C

Nc(50%)

Temperature effect on 16K FLASH Program / Erase

AT(125d/25d) = 11.8 - Ea = 0.25eV

AT56800 FLASH / EEPROM Reliability Calculation:

Global

Calculation

AT56800

Microcontrollers

Data-Retention Test

165°c

250°c

0/1101000

0/251496

For

current

sample

size

expressed in device*hours,

Ea = 0.7eV, CL = 60%, T = 55°:

?DR = 0.29 fit

Endurance Cycling

55°c

1/109850k Failure : 1 bit charge loss

For sample size expressed in

equivalent cycles at 55°c, and

assuming one cycle per day,

Ea = 0.25eV, CL = 60%:

?EC = 0.76 fit

AT89C51ED2-RDTIM 数据表(PDF) 19 Page - ATMEL Corporation

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