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ENICSF2811PBKA 数据表(PDF) 159 Page - Texas Instruments |
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ENICSF2811PBKA 数据表(HTML) 159 Page - Texas Instruments |
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159 / 172 page ![]() larger) is whichever 1, or integer, highest next the to up (round 1 t t State Wait Random ROM c(SCO) a(rr) ú ú û ù ê ê ë é - ÷ ÷ ø ö ç ç è æ = larger) is whichever 0, or integer, highest next the to up (round 1 t t State Wait Page ROM c(SCO) a(rp) ú ú û ù ê ê ë é - ÷ ÷ ø ö ç ç è æ = TMS320F2810, TMS320F2811, TMS320F2812 TMS320C2810, TMS320C2811, TMS320C2812 www.ti.com SPRS174T – APRIL 2001 – REVISED MAY 2012 6.33 ROM Timing (C281x only) Table 6-65. ROM Access Timing PARAMETER MIN MAX UNIT ta(rp) Paged ROM access time 23 ns ta(rr) Random ROM access time 23 ns ta(ROM) ROM (OTP area) access time(1) 60 ns (1) In C281x devices, a 1K × 16 ROM block replaces the OTP block found in Flash devices. Table 6-66. Minimum Required ROM Wait States at Different Frequencies (C281x devices) SYSCLKOUT (MHz) SYSCLKOUT (ns) PAGE WAIT STATE(1) RANDOM WAIT STATE(1) (2) 150 6.67 3 3 120 8.33 2 2 100 10 2 2 75 13.33 1 1 50 20 1 1 30 33.33 0 1 25 40 0 1 15 66.67 0 1 4 250 0 1 (1) Formulas to compute page wait state and random wait state: (2) Random wait state must be greater than or equal to 1. Copyright © 2001–2012, Texas Instruments Incorporated Electrical Specifications 159 Submit Documentation Feedback Product Folder Link(s): TMS320F2810 TMS320F2811 TMS320F2812 TMS320C2810 TMS320C2811 TMS320C2812 |
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