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L9679P 数据表(PDF) 164 Page - STMicroelectronics

部件名 L9679P
功能描述  Automotive advanced airbag IC for mid/high end applications
PDF  272 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

L9679P 数据表(HTML) 164 Page - STMicroelectronics

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DocID029275 Rev 1
Short between loops diagnostics
In case the previous test has reported a leakage to ground fault, the short between loops
diagnostics shall be run. The same procedure is followed as described for normal leakage
tests except the fact that in this case all the pull-down current generators have to be
deactivated (not only the one for the pin under test), by means of the PD_CURR bit in the
Diagnostic Request Register (LPDIAGREQ). If a leakage or ground fault is not present, then
the channel under test has a short to another squib loop.
The condition of two open channels, i.e. without squib resistance connecting SFx to SRx,
that have a short between loops on SFx cannot be detected. If only one of the two shorted
SFx pins is open, the fault will be indicated on the open channel.
Squib resistance measurement
During a resistance measurement, a two-step process is performed. At the first step, both
ISRC current generator and ISNK current limited switch are enabled and connected to the
selected SFx and SRx channel, through ISRC, ISRC_CURR_SEL, ISNK and
RES_MEAS_CHSEL bit fields in the Loop Diagnostic Request Register (LPDIAGREQ). The
ISRC current can be configured to either 40 mA or 8 mA nominal value through the
ISRC_CURR_SEL bit in the LPDIAGREQ register providing the user with two different
measurement range options. A differential voltage is created between the SFx and SRx pin
based on the ISRC current and squib resistance between the pins. The SPI interface will
provide the first resistance measurement voltage (Vdiff1) based on the amplifying factor of
the differential amplifier and a 10 bit internal ADC conversion. The second measurement
step (bypass measurement) is performed redirecting ISRC to the selected SRx pin, while
keeping ISNK on; this way, the differential amplifier and following ADC will output the offset
measurement through SPI (Vdiff2). Microcontroller is then allowed to calculate the
mathematical difference between first and second measurements to obtain the real squib
resistance value.
Vdiff1
GRSQ
ISRC_*
RLKG_SF RSQ
RLKG_SF RSQ
+
--------------------------------------------



RSQ
RLKG_SF RSQ
+
-------------------------------------------- VLKG_SF VSRx_RM

+
+
=
+ GRSQ Voff_RSQ
Vdiff2
GRSQ RSQ
RLKG_SF RSQ
+
--------------------------------------------
VLKG_SF VSRx_RM

GRSQ Voff_RSQ
+
=
RSQ
Vdiff1 Vdiff2
GRSQ ISRC_*
-----------------------------------------
=
(assuming RLKG_SF >> RSQ)
Table 10. Short between loops diagnostics decoding
Fault condition on
squib channel
Channel leakage diagnostics with
PD_CURR on (for other channels
than the one under test
Channel leakage diagnostics
with PD_CURR off
(for all channels)
No shorts
No fault
No fault
Short to battery
STB fault
STB fault
Short to ground
STG fault
STG fault
Short between loops
STG fault
No fault



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