BLUENRG-332VC datasheet(46/67 Pages) STMICROELECTRONICS

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Table 33. Flash memory endurance and data retention

Symbol

Parameter

Test conditions

Min.

Unit

NEND

Endurance

TA = -40 to +105 ºC

kcycles

tRET

Data retention

TA = 105 ºC

Years

6.3.15

Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each

sample according to each pin combination. The sample size depends on the number of supply pins in the device

(3 parts x (n + 1) supply pins). This test conforms to the ANSI/JEDEC standard.

Table 34. ESD absolute maximum ratings

Symbol

Parameter

Conditions

Class Max.(1) Unit

VESD(HBM)

Electrostatic discharge voltage (human body

model)

Conforming to ANSI/ESDA/JEDEC JS-001

2000

VESD(CBM)

Electrostatic discharge voltage (charge

device model)

Conforming to ANSI/ESDA/STM5.3.1

JS-002

C2a

500

1. Guaranteed by design.

6.3.16

I/O port characteristics

Unless otherwise specified, the parameters given in the tables below are derived from tests performed under the

conditions summarized in Table 15. General operating conditions. All I/Os are designed as CMOS-compliant.

Table 35. I/O static characteristics

Symbol

Parameter

Conditions

Min.

Typ.

Max.

Unit

VIL

I/O input low level voltage

1.62 V < VDD < 3.6 V

0.3 x VDD

VIH

I/O input high level voltage

0.7 x VDD

Ilkg

Input leakage current

0 <= VIN <= Max(VDDx)(1)

+/-100

Max(VDDx)(1) <= VIN <= Max(VDDx)(1) +1 V

650

Max(VDDx)(1) + 1 V < VIN <= 5.5 V

200

RPU

Pull-up resistor

VIN = GND

kΩ

RPD

Pull-down resistor

VIN = VDD

CIO

I/O pin capacitance

1. Max(VDDx) is the maximum value among all the I/O supplies.

All I/Os are CMOS-compliant (no software configuration required).

GPIOs (general purpose input/outputs) can sink or source up to ±8 mA and sink or source up to ± 20 mA (with a

relaxed VOL / VOH).

In the user application, the number of I/O pins that can drive current must be limited to respect the absolute

maximum rating specified.

•

The sum of currents sourced by all I/Os on VDD, plus the maximum consumption of MCU sourced on VDD,

cannot exceed the absolute maximum rating ΣIVDD

•

The sum of currents sunk by all I/Os on VSS, plus the maximum consumption of the MCU sunk on GND,

cannot exceed the absolute maximum rating ΣIVGND.

BlueNRG-LPS

Operating conditions

DS13819 - Rev 4

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