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MPC8541ECVTALF 数据表(PDF) 19 Page - Freescale Semiconductor, Inc |
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MPC8541ECVTALF 数据表(HTML) 19 Page - Freescale Semiconductor, Inc |
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19 / 84 page ![]() MPC8541E PowerQUICC™ III Integrated Communications Processor Hardware Specifications, Rev. 4 Freescale Semiconductor 19 DUART Figure 5 provides the AC test load for the DDR bus. Figure 5. DDR AC Test Load 7DUART This section describes the DC and AC electrical specifications for the DUART interface of the MPC8541E. 7.1 DUART DC Electrical Characteristics Table 16 provides the DC electrical characteristics for the DUART interface of the MPC8541E. Table 15. DDR SDRAM Measurement Conditions Symbol DDR Unit Notes VTH MVREF ± 0.31 V V 1 VOUT 0.5 × GV DD V2 Notes: 1. Data input threshold measurement point. 2. Data output measurement point. Table 16. DUART DC Electrical Characteristics Parameter Symbol Test Condition Min Max Unit High-level input voltage VIH VOUT ≥ VOH (min) or 2 OVDD + 0.3 V Low-level input voltage VIL VOUT ≤ VOL (max) –0.3 0.8 V Input current IIN VIN 1 = 0 V or V IN = VDD —±5 μA High-level output voltage VOH OVDD = min, IOH = –100 μA OVDD – 0.2 — V Low-level output voltage VOL OVDD = min, IOL = 100 μA— 0.2 V Note: 1. Note that the symbol VIN, in this case, represents the OVIN symbol referenced in Table 1 and Table 2. Output Z0 = 50 Ω GVDD/2 RL = 50 Ω |
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