TUSB564 datasheet(32/52 Pages) TI

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8.2.2.1 ESD Protection

It may be necessary to incorporate an ESD component to protect the TUSB564-Q1 from electrostatic discharge

(ESD). TI recommends following the ESD protection recommendations listed in Table 8-2. A clamp voltage

greater than value specified in Table 8-2 may require a RESD on each differential pin. Place the ESD component

near the USB connector.

Table 8-2. ESD Diodes Recommended Characteristics

PARAMETER

RECOMMENDATION

Breakdown voltage

≥ 3.5V

I/O line capacitance

Data rates ≤ 5Gbps: ≤ 0.50pF

Data rates > 5Gbps: ≤ 0.35pF

Delta capacitance between any P and N I/O pins

≤ 0.07pF

Clamping voltage at 8A IPP IO to GND (1)

≤ 4.5V

Typical dynamic resistance

≤ 30mΩ

(1)

According to IEC 61000-4-5 (8/20μs current waveform)

Table 8-3. Recommended ESD Protection Component

MANUFACTURER

PART NUMBER

RESD TO SUPPORT IEC 61000-4-2 CONTACT ±8kV

Nexperia

PUSB3FR4

1Ω

Nexperia

PESD2V8Y1BSF

1Ω

Texas Instruments

TPD1E04U04DPLR

2Ω

Texas Instruments

TPD4E02B04DQAR

2Ω

TUSB564-Q1

SLLSFO9A – MAY 2024 – REVISED SEPTEMBER 2024

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