ST7LITEUSX datasheet(80/108 Pages) STMICROELECTRONICS

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ST7LITEUSx

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EMC CHARACTERISTICS (Cont’d)

12.7.3.2 Static and Dynamic Latch-Up

■ LU: 3 complementary static tests are required

on 10 parts to assess the latch-up performance.

A supply overvoltage (applied to each power

supply pin) and a current injection (applied to

each input, output and configurable I/O pin) are

performed on each sample. This test conforms

to the EIA/JESD 78 IC latch-up standard. For

more details, refer to the application note

AN1181.

■ DLU: Electro-Static Discharges (one positive

then one negative test) are applied to each pin

of 3 samples when the micro is running to

assess the latch-up performance in dynamic

mode. Power supplies are set to the typical

values, the oscillator is connected as near as

possible to the pins of the micro and the

component is put in reset mode. This test

conforms to the IEC1000-4-2 and SAEJ1752/3

standards. For more details, refer to the

application note AN1181.

Electrical Sensitivities

Note:

1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-

ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the

JEDEC criteria (international standard).

Symbol

Parameter

Conditions

Class 1)

Static latch-up class

TA=+125°C

DLU

Dynamic latch-up class

VDD=5.5V, fOSC=4MHz, TA=+25°C

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