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BQ40Z50-R2 数据表(PDF) 14 Page - Texas Instruments |
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BQ40Z50-R2 数据表(HTML) 14 Page - Texas Instruments |
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14 / 55 page ![]() 7.18 CHG, DSG FET Drive (continued) Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC = 2.2 V to 26 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tF Fall time VDSG from VDSG(ON)(TYP) to 1 V, VBAT ≥ 2.2 V, CL = 4.7 nF between DSG and PACK, 5.1 kΩ between DSG and CL, 10 MΩ between PACK and DSG 40 300 µs VCHG from VCHG(ON)(TYP) to 1 V, VBAT ≥ 2.2 V, CL = 4.7 nF between CHG and BAT, 5.1 kΩ between CHG and CL, 10 MΩ between BAT and CHG 40 200 7.19 PCHG FET Drive Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC = 2.2 V to 26 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT V(FETON) Output voltage, PCHG on VPCHG(ON) = VVCC – VPCHG, 10 MΩ between VCC and PCHG 6 7 8 V V(FETOFF) Output voltage, PCHG off VPCHG(OFF) = VVCC – VPCHG, 10 MΩ between VCC and PCHG –0.4 0.4 V tR Rise time VPCHG from 10% to 90% VPCHG(ON)(TYP), VVCC ≥ 8 V, CL = 4.7 nF between PCHG and VCC, 5.1 kΩ between PCHG and CL, 10 MΩ between VCC and CHG 40 200 µs tF Fall time VPCHG from 90% to 10% VPCHG(ON)(TYP), VCC ≥ 8 V, CL = 4.7 nF between PCHG and VCC, 5.1 kΩ between PCHG and CL, 10 MΩ between VCC and CHG 40 200 µs 7.20 FUSE Drive Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC = 2.2 V to 26 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VOH Output voltage high VBAT ≥ 8 V, CL = 1 nF, IAFEFUSE = 0 µA 6 7 8.65 V VBAT < 8 V, CL = 1 nF, IAFEFUSE = 0 µA VBAT – 0.1 VBAT VIH High-level input 1.5 2.0 2.5 V IAFEFUSE(PU) Internal pullup current VBAT ≥ 8 V, VAFEFUSE = VSS 150 330 nA RAFEFUSE Output impedance 2 2.6 3.2 kΩ CIN Input capacitance 5 pF tDELAY Fuse trip detection delay 128 256 µs tRISE Fuse output rise time VBAT ≥ 8 V, CL = 1 nF, VOH = 0 V to 5 V 5 20 µs 7.21 Internal Temperature Sensor Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC = 2.2 V to 26 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VTEMP Internal temperature sensor voltage drift VTEMPP –1.9 –2.0 –2.1 mV/°C VTEMPP – VTEMPN, assured by design 0.177 0.178 0.179 BQ40Z50-R2 SLUSCS4C – JUNE 2017 – REVISED APRIL 2021 www.ti.com 14 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: BQ40Z50-R2 |
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