L6000 datasheet(13/24 Pages) STMICROELECTRONICS

13 / 24 page

DATA SEPARATOR DYNAMIC CHARACTERISTICS AND TIMING (Continued)

Symbol

Parameter

Test Condition

Min.

Typ.

Max.

Unit

TAS, TAH

AMD Set Up and Hold Time

(**)

–

TPAMD

AMD Propagation Delay

(**)

–

±15

1/3 Cell Delay

TD = 1/FSOUT,RR = 39K

Ω (***) 0.8TD

1.2TD

Write Mode

TWD

Write Data Pulse Width

1.5V

2TFout/3

≤ 15pF

– 5

+ 5

TRWD

Write Data Rise Time

0.8V to 2.0V, CL

≤ 15pF

–

TFWD

Write Data Fall Time

2.0V to 0.8V, CL

≤ 15pF

–

TRWC

Write Data Clock Rise Time

0.8V to 2.0V, CL

≤ 15pF

–

TFWC

Write Data Clock Fall Time

2.0V to 0.8V, CL

≤ 15pF

–

TSNRZ

NRZ Set Up Time

–

THNRZ

NRZ Hold Time

–

TPC

Precompensation Time Shift

Magnitude Accuracy

TPCO = 0.04TREF

TPC(max) = 0.28TREF

TPC = nTPCO

n =0

≤ n ≤ 7

– 0.5

n(0.8TPCO)

– 0.5

+ 0.5

n(1.2TPCO)

+0.5

Data Synchronization

TVCO

VCO Center Frequency Period

FLTR2-FLTR2 = 0

TO = (8.95 + 0.786 x DR)

-1,

RR = 39k

Ω (***)

0.9TO

1.1TO

VCO Frequency Dynamic range

–1.5

≤ FLTR-FLTR2 ≤ +1.5 (***)

±25

±45

KVCO

VCO Control Gain

ωo=

TVCO

0.14Wo

0.26Wo rad/(Vxs)

–1.5

≤ FLTR-FLTR2 ≤ +1.5

Phase Detector Gain

Read: KD = 0.7 + 0.43 x DR,

PLL REF = RD 3T Pattern, Non-

Read: KD = 0.7 + 0.43 x DR,

PLLREF = Fout / 2 (***)

0.83KD

1.17KD

A/rad

KVCO x KD Product Accuracy

– 28

+ 28

VCO Phase Restart Error

–

Decode Window Cent. Accuracy

–

±1.5

Decode Window Width

2TORC/3

- 1.5

–ns

SERIAL PORT TIMING

Symbol

Parameter

Test Condition

Min.

Typ.

Max.

Unit

SERIAL CLOCK+ Data Clock Period

100

–

Tck1

SERIAL CLOCK+ Low Time

–

TcKh

SERIAL CLOCK+ High Time

–

Tsens

Enable to Clock Delay Time

–

Tsenh

Clock to Disable Delay Time

Delay from SERIAL

CLOCK+ falling edge

100

–

Tds

Data Setup Time

–

Tdh

Data Hold Time

–

Tdskewl

Clock to Valid Data Delay Time

Delay from SERIAL

CLOCK+ falling edge

–27

Tdskewe

End of Valid Data to Clock

–

Tsendl

Time to Tri-stated SERIAL DATA I/O

Delay from falling edge

of SERIAL ENABLE

–50

Tturnd

SERIAL DATA I/O Turnaround Time

–

Tsl

SERIAL ENABLE Low Time

200

–

(**) Bench test only. (***) Preliminary data.

L6000

13/24

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