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STM32F427AI 数据表(PDF) 130 Page - STMicroelectronics |
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STM32F427AI 数据表(HTML) 130 Page - STMicroelectronics |
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130 / 240 page ![]() Electrical characteristics STM32F427xx STM32F429xx 130/240 DS9405 Rev 12 tBE Bank erase time Program/erase parallelism (PSIZE) = x 8 -16 32 s Program/erase parallelism (PSIZE) = x 16 -11 22 Program/erase parallelism (PSIZE) = x 32 -8 16 Vprog Programming voltage 32-bit program operation 2.7 - 3.6 V 16-bit program operation 2.1 - 3.6 V 8-bit program operation 1.7 - 3.6 V 1. Evaluated by characterization. 2. The maximum programming time is measured after 100 K erase operations. Table 49. Flash memory programming with VPP Symbol Parameter Conditions Min(1) Typ Max(1) 1. Specified by design. Unit tprog Double word programming TA = 0 to +40 °C VDD = 3.3 V VPP = 8.5 V -16 100(2) 2. The maximum programming time is measured after 100 K erase operations. µs tERASE16KB Sector (16 KB) erase time - 230 - ms tERASE64KB Sector (64 KB) erase time - 490 - tERASE128KB Sector (128 KB) erase time - 875 - tME Mass erase time - 6.9 - s tBE Bank erase time - - 6.9 - s Vprog Programming voltage - 2.7 - 3.6 V VPP VPP voltage range - 7 - 9 V IPP Minimum current sunk on the VPP pin -10 - - mA tVPP(3) 3. VPP should only be connected during programming/erasing. Cumulative time during which VPP is applied - - - 1 hour Table 48. Flash memory programming (continued) Symbol Parameter Conditions Min(1) Typ Max(1) Unit |
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