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STM32F427AI 数据表(PDF) 134 Page - STMicroelectronics

部件名 STM32F427AI
功能描述  32b Arm® Cortex®-M4 MCUFPU, 225DMIPS, up to 2MB Flash/2564KB RAM, USB OTG HS/FS, Ethernet, 17 TIMs, 3 ADCs, 20 com. interfaces, camera & LCD-TFT
PDF  240 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

STM32F427AI 数据表(HTML) 134 Page - STMicroelectronics

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Electrical characteristics
STM32F427xx STM32F429xx
134/240
DS9405 Rev 12
Static latchup
Two complementary static tests are required on six parts to assess the latchup
performance:
A supply overvoltage is applied to each power supply pin
A current injection is applied to each input, output, and configurable I/O pin
These tests are compliant with the EIA/JESD 78A IC latchup standard.
6.3.16
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product
operation. However, to give an indication of the robustness of the microcontroller in cases
when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
An out of range parameter indicates the failure: ADC error above a certain limit (>5 LSB
TUE), out of conventional limits of induced leakage current on adjacent pins (out of –
5 µA/+0 µA range), or other functional failure (for example reset, oscillator frequency
deviation).
Negative induced leakage current is caused by negative injection and positive induced
leakage current by positive injection.
The test results are given in Table 56.
Table 55. Electrical sensitivities
Symbol
Parameter
Conditions
Class
LU
Static latch-up class
TA = +105 °C conforming to JESD78A
II level A
Table 56. I/O current injection susceptibility(1)
Symbol
Description
Functional susceptibility
Unit
Negative
injection
Positive
injection
IINJ
Injected current on BOOT0 pin
− 0NA
mA
Injected current on NRST pin
− 0NA
Injected current on PA0, PA1, PA2, PA3, PA6, PA7, PB0,
PC0, PC1, PC2, PC3, PC4, PC5, PH1, PH2, PH3, PH4, PH5
− 0NA
Injected current on TTa pins: PA4 and PA5
− 0+5
Injected current on any other FT pin
− 5NA
1. NA = not applicable
.



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