STM32F427AI datasheet(132/240 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32F427xx STM32F429xx

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DS9405 Rev 12

Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical

application environment and simplified MCU software. It should be noted that good EMC

performance is highly dependent on the user application and the software in particular.

Therefore, it is recommended that the user applies EMC software optimization and

prequalification tests in relation with the EMC level requested for his application.

Software recommendations

The software flowchart must include the management of runaway conditions such as:

•

Corrupted program counter

•

Unexpected reset

•

Critical data corruption (control registers...)

Prequalification trials

Most of the common failures (unexpected reset and program counter corruption) can be

reproduced by manually forcing a low state on the NRST pin or the oscillator pins for 1

second.

To complete these trials, ESD stress can be applied directly on the device, over the range of

specification values. When unexpected behavior is detected, the software can be hardened

to prevent unrecoverable errors occurring (see application note AN1015).

Electromagnetic Interference (EMI)

The electromagnetic field emitted by the device is monitored while a simple application,

executing EEMBC? code, is running. This emission test is compliant with SAE IEC61967-2

standard, which specifies the test board and the pin loading.

Table 52. EMI characteristics for fHSE= 25 MHz and fCPU= 168 MHz

Symbol Parameter

Conditions

Monitored

frequency band

Max vs.

[fHSE/fCPU] Unit

25/168 MHz

SEMI

Peak(1)

VDD = 3.3 V, TA = 25 °C, LQFP176

package, conforming to SAE J1752/3

EEMBC, ART ON, all peripheral

clocks enabled, clock dithering

disabled.

0.1 to 30 MHz

dBµV

30 to 130 MHz

130 MHz to

1GHz

Level(2)

0.1 MHz to

1GHz

Peak(1)

VDD = 3.3 V, TA = 25 °C, LQFP176

package, conforming to SAE J1752/3

EEMBC, ART ON, all peripheral

clocks enabled, clock dithering

enabled

0.1 to 30 MHz

dBµV

30 to 130 MHz

130 MHz to

1GHz

Level(2)

0.1 MHz to

1GHz

3.5

1. Refer to chapter “EMI radiated test” in AN1709.

2. Refer to chapter “EMI level classification” in AN1709.

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