ST7FOXK2 datasheet(203/226 Pages) STMICROELECTRONICS

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ST7FOXF1, ST7FOXK1, ST7FOXK2

Electrical characteristics

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12.8.3

Absolute maximum ratings (electrical sensitivity)

Based on two different tests (ESD and LU) using specific measurement methods, the

product is stressed in order to determine its performance in terms of electrical sensitivity.

Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size

depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models

can be simulated: Human Body model and Machine model. This test conforms to the

JESD22-A114A/A115A standard. For more details, refer to the application note AN1181.

Static latch-up (LU)

Two complementary static tests are required on six parts to assess the latch-up

performance.

●

A supply overvoltage is applied to each power supply pin

●

A current injection is applied to each input, output and configurable I/O pin.

These tests are compliant with the EIA/JESD 78 IC latch-up standard.

Table 85.

ESD absolute maximum ratings

Symbol

Ratings

Conditions

Maximum

value(1)

Data based on characterization results, not tested in production.

Unit

VESD(HBM)

Electrostatic discharge voltage (Human Body

model)

TA=+25 °C

4000

VESD(CDM)

Electrostatic discharge voltage (Charge Device

model)

TA=+25 °C

500

Table 86.

Electrical sensitivities

Symbol

Parameter

Conditions

Class

Static latch-up class

TA = +85 °C

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