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EM78P468NBQS/NBQJ 数据表(PDF) 82 Page - ELAN Microelectronics Corp |
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EM78P468NBQS/NBQJ 数据表(HTML) 82 Page - ELAN Microelectronics Corp |
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82 / 82 page ![]() EM78P468N/L 8-Bit Microcontroller 76 • Product Specification (V1.6) 12.31.2007 (This specification is subject to change without further notice) E Quality Assurance and Reliability Test Category Test Conditions Remarks Solderability Solder temperature=245 ±5°C, for 5 seconds up to the stopper using a rosin-type flux – Step 1: TCT, 65°C (15mins)~150°C (15mins), 10 cycles Step 2: Bake at 125°C, TD (endurance)=24 hrs Step 3: Soak at 30°C/60% ,TD (endurance)=192 hrs Pre-condition Step 4: IR flow 3 cycles (Pkg thickness ≥ 2.5mm or Pkg volume ≥ 350mm 3 ----225±5°C) (Pkg thickness ≤ 2.5mm or Pkg volume ≤ 350mm 3 ----240±5°C) For SMD IC (such as SOP, QFP, SOJ, etc) Temperature cycle test -65°C (15mins)~150°C (15mins), 200 cycles – Pressure cooker test TA =121°C, RH=100%, pressure=2 atm, TD (endurance)= 96 hrs – High temperature / High humidity test TA=85°C , RH=85% ,TD (endurance) = 168 , 500 hrs – High-temperature storage life TA=150°C, TD (endurance) = 500, 1000 hrs – High-temperature operating life TA=125°C, VCC = Max. operating voltage, TD (endurance) = 168, 500, 1000 hrs – Latch-up TA=25°C, VCC = Max. operating voltage, 150mA/20V – ESD (HBM) TA=25°C, ≥ ± 3KV ESD (MM) TA=25°C, ≥ ± 300V IP_ND,OP_ND,IO_ND IP_NS,OP_NS,IO_NS IP_PD,OP_PD,IO_PD IP_PS,OP_PS,IO_PS VDD-VSS(+),VDD_VSS (-) Mode E.1 Address Trap Detect An address trap detect is one of the MCU embedded fail-safe functions that detects MCU malfunction caused by noise or the like. Whenever the MCU attempts to fetch an instruction from a certain section of ROM, an internal recovery circuit is auto started. If a noise-caused address error is detected, the MCU will repeat execution of the program until the noise is eliminated. The MCU will then continue to execute the next program. |
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