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GS9062-CFE3 数据表(PDF) 40 Page - Gennum Corporation

部件名 GS9062-CFE3
功能描述  HD-LINX II SD-SDI and DVB-ASI Serializer with ClockCleaner
PDF  46 Pages
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制造商  GENNUM [Gennum Corporation]
网页  http://www.gennum.com
标志 GENNUM - Gennum Corporation

GS9062-CFE3 数据表(HTML) 40 Page - Gennum Corporation

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GS9062 Data Sheet
22209 - 7
February 2007
40 of 46
3.11 JTAG
When the JTAG/HOST input pin of the GS9062 is set HIGH, the host interface port
will be configured for JTAG test operation. In this mode, pins 27 through 30
become TMS, TDO, TDI, and TCK. In addition, the RESET_TRST pin will operate
as the test reset pin.
Boundary scan testing using the JTAG interface will be enabled in this mode.
There are two methods in which JTAG can be used on the GS9062:
1. As a stand-alone JTAG interface to be used at in-circuit ATE (Automatic Test
Equipment) during PCB assembly; or
2. Under control of the host for applications such as system power on self tests.
When the JTAG tests are applied by ATE, care must be taken to disable any other
devices driving the digital I/O pins. If the tests are to be applied only at ATE, this
can be accomplished with tri-state buffers used in conjunction with the
JTAG/HOST input signal. This is shown in Figure 3-11.
Figure 3-11: In-Circuit JTAG
Table 3-11: GS9062 Internal Registers
Address
Register Name
See Section
00h
IOPROC_DISABLE
Section 3.6.3
02h
EDH_FLAG
Section 3.6.3.3
04h
VIDEO_STANDARD
Section 3.6.2
0Ah - 0Bh
VIDEO_FORMAT
Section 3.6.3.1
0Eh - 11h
RASTER_STRUCTURE
Section 3.6.2
12h - 19h
EDH_CALC_RANGES
Section 3.6.3.3
1Bh - 1Ch
LINE_352M
Section 3.6.3.1
Application HOST
GS9062
CS_TMS
SCLK_TCK
SDIN_TDI
SDOUT_TDO
JTAG_HOST
In-circuit ATE probe



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