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SPC56AP54X 数据表(PDF) 86 Page - STMicroelectronics |
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SPC56AP54X 数据表(HTML) 86 Page - STMicroelectronics |
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86 / 104 page  Electrical characteristics SPC56xP54x, SPC56xP60x 86/104 Doc ID 18340 Rev 3 3.18.2 IEEE 1149.1 interface timing Figure 22. JTAG test clock input timing Table 38. JTAG pin AC electrical characteristics No. Symbol C Parameter Conditions Min Max Unit 1tJCYC CC D TCK cycle time — 100 — ns 2tJDC CC D TCK clock pulse width (measured at VDD_HV_IOx/2) — 40 60 ns 3tTCKRISE CC D TCK rise and fall times (40% – 70%) — — 3 ns 4tTMSS, tTDIS CC D TMS, TDI data setup time — 5 — ns 5tTMSH, tTDIH CC D TMS, TDI data hold time — 25 — ns 6tTDOV CC D TCK low to TDO data valid — — 40 ns 7tTDOI CC D TCK low to TDO data invalid — 0 — ns 8tTDOHZ CC D TCK low to TDO high impedance — 40 — ns 9tBSDV CC D TCK falling edge to output valid — — 50 ns 10 tBSDVZ CC D TCK falling edge to output valid out of high impedance — — 50 ns 11 tBSDHZ CC D TCK falling edge to output high impedance — — 50 ns 12 tBSDST CC D Boundary scan input valid to TCK rising edge — 50 — ns 13 tBSDHT CC D TCK rising edge to boundary scan input invalid — 50 — ns TCK 1 2 2 3 3 |
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